{
  "schema": "semiagora.deep-simulation.v1",
  "execution_mode": "precomputed-only",
  "experiment_id": "SA-DEV-001-FINFET-FINCOUNT-PPA-001",
  "slug": "finfet-fin-count-ppa",
  "title": "FinFET fin count versus PPA",
  "model_boundary": "normalized advanced-device teaching model, no calibrated TCAD or PDK",
  "public_boundary": [
    "No live server solver execution.",
    "No PDK or proprietary compact-model ingestion, measured-silicon claim, qualification signoff, upload, account, payment, comment, newsletter signup, or submission workflow.",
    "Third-party tools and source pages remain source links unless separately reviewed."
  ],
  "headline_metric": {
    "name": "highest_ppa_score",
    "value": 128.1484,
    "case": {
      "fins": 1,
      "gate_length_nm": 10,
      "vt_flavor": "SVT"
    }
  },
  "rows": [
    {
      "simulation_id": "SA-DEV-001-FINFET-FINCOUNT-PPA-001",
      "domain": "device",
      "fins": 1,
      "gate_length_nm": 10,
      "vt_flavor": "LVT",
      "drive_current_ua_proxy": 119.656,
      "gate_cap_ff_proxy": 0.66,
      "leakage_na_proxy": 22.27,
      "delay_index": 5.51583,
      "ppa_score": 116.4583,
      "teaching_point": "Fin count improves drive, but capacitance and leakage decide whether the PPA tradeoff is actually better."
    },
    {
      "simulation_id": "SA-DEV-001-FINFET-FINCOUNT-PPA-001",
      "domain": "device",
      "fins": 1,
      "gate_length_nm": 10,
      "vt_flavor": "SVT",
      "drive_current_ua_proxy": 96.564,
      "gate_cap_ff_proxy": 0.66,
      "leakage_na_proxy": 5.6687,
      "delay_index": 6.83483,
      "ppa_score": 128.1484,
      "teaching_point": "Fin count improves drive, but capacitance and leakage decide whether the PPA tradeoff is actually better."
    },
    {
      "simulation_id": "SA-DEV-001-FINFET-FINCOUNT-PPA-001",
      "domain": "device",
      "fins": 1,
      "gate_length_nm": 14,
      "vt_flavor": "LVT",
      "drive_current_ua_proxy": 103.887,
      "gate_cap_ff_proxy": 0.732,
      "leakage_na_proxy": 14.8719,
      "delay_index": 7.04615,
      "ppa_score": 103.4566,
      "teaching_point": "Fin count improves drive, but capacitance and leakage decide whether the PPA tradeoff is actually better."
    },
    {
      "simulation_id": "SA-DEV-001-FINFET-FINCOUNT-PPA-001",
      "domain": "device",
      "fins": 1,
      "gate_length_nm": 14,
      "vt_flavor": "SVT",
      "drive_current_ua_proxy": 83.838,
      "gate_cap_ff_proxy": 0.732,
      "leakage_na_proxy": 3.7856,
      "delay_index": 8.7311,
      "ppa_score": 104.631,
      "teaching_point": "Fin count improves drive, but capacitance and leakage decide whether the PPA tradeoff is actually better."
    },
    {
      "simulation_id": "SA-DEV-001-FINFET-FINCOUNT-PPA-001",
      "domain": "device",
      "fins": 1,
      "gate_length_nm": 18,
      "vt_flavor": "LVT",
      "drive_current_ua_proxy": 93.48,
      "gate_cap_ff_proxy": 0.804,
      "leakage_na_proxy": 11,
      "delay_index": 8.60077,
      "ppa_score": 91.1911,
      "teaching_point": "Fin count improves drive, but capacitance and leakage decide whether the PPA tradeoff is actually better."
    },
    {
      "simulation_id": "SA-DEV-001-FINFET-FINCOUNT-PPA-001",
      "domain": "device",
      "fins": 1,
      "gate_length_nm": 18,
      "vt_flavor": "SVT",
      "drive_current_ua_proxy": 75.44,
      "gate_cap_ff_proxy": 0.804,
      "leakage_na_proxy": 2.8,
      "delay_index": 10.65748,
      "ppa_score": 87.6924,
      "teaching_point": "Fin count improves drive, but capacitance and leakage decide whether the PPA tradeoff is actually better."
    },
    {
      "simulation_id": "SA-DEV-001-FINFET-FINCOUNT-PPA-001",
      "domain": "device",
      "fins": 2,
      "gate_length_nm": 10,
      "vt_flavor": "LVT",
      "drive_current_ua_proxy": 239.311,
      "gate_cap_ff_proxy": 1.32,
      "leakage_na_proxy": 44.5399,
      "delay_index": 5.51583,
      "ppa_score": 85.7802,
      "teaching_point": "Fin count improves drive, but capacitance and leakage decide whether the PPA tradeoff is actually better."
    },
    {
      "simulation_id": "SA-DEV-001-FINFET-FINCOUNT-PPA-001",
      "domain": "device",
      "fins": 2,
      "gate_length_nm": 10,
      "vt_flavor": "SVT",
      "drive_current_ua_proxy": 193.128,
      "gate_cap_ff_proxy": 1.32,
      "leakage_na_proxy": 11.3374,
      "delay_index": 6.83483,
      "ppa_score": 113.9982,
      "teaching_point": "Fin count improves drive, but capacitance and leakage decide whether the PPA tradeoff is actually better."
    },
    {
      "simulation_id": "SA-DEV-001-FINFET-FINCOUNT-PPA-001",
      "domain": "device",
      "fins": 2,
      "gate_length_nm": 14,
      "vt_flavor": "LVT",
      "drive_current_ua_proxy": 207.773,
      "gate_cap_ff_proxy": 1.464,
      "leakage_na_proxy": 29.7438,
      "delay_index": 7.04615,
      "ppa_score": 81.396,
      "teaching_point": "Fin count improves drive, but capacitance and leakage decide whether the PPA tradeoff is actually better."
    },
    {
      "simulation_id": "SA-DEV-001-FINFET-FINCOUNT-PPA-001",
      "domain": "device",
      "fins": 2,
      "gate_length_nm": 14,
      "vt_flavor": "SVT",
      "drive_current_ua_proxy": 167.677,
      "gate_cap_ff_proxy": 1.464,
      "leakage_na_proxy": 7.5711,
      "delay_index": 8.7311,
      "ppa_score": 96.3047,
      "teaching_point": "Fin count improves drive, but capacitance and leakage decide whether the PPA tradeoff is actually better."
    },
    {
      "simulation_id": "SA-DEV-001-FINFET-FINCOUNT-PPA-001",
      "domain": "device",
      "fins": 2,
      "gate_length_nm": 18,
      "vt_flavor": "LVT",
      "drive_current_ua_proxy": 186.96,
      "gate_cap_ff_proxy": 1.608,
      "leakage_na_proxy": 22,
      "delay_index": 8.60077,
      "ppa_score": 75.012,
      "teaching_point": "Fin count improves drive, but capacitance and leakage decide whether the PPA tradeoff is actually better."
    },
    {
      "simulation_id": "SA-DEV-001-FINFET-FINCOUNT-PPA-001",
      "domain": "device",
      "fins": 2,
      "gate_length_nm": 18,
      "vt_flavor": "SVT",
      "drive_current_ua_proxy": 150.88,
      "gate_cap_ff_proxy": 1.608,
      "leakage_na_proxy": 5.6,
      "delay_index": 10.65748,
      "ppa_score": 82.3078,
      "teaching_point": "Fin count improves drive, but capacitance and leakage decide whether the PPA tradeoff is actually better."
    },
    {
      "simulation_id": "SA-DEV-001-FINFET-FINCOUNT-PPA-001",
      "domain": "device",
      "fins": 3,
      "gate_length_nm": 10,
      "vt_flavor": "LVT",
      "drive_current_ua_proxy": 358.967,
      "gate_cap_ff_proxy": 1.98,
      "leakage_na_proxy": 66.8099,
      "delay_index": 5.51583,
      "ppa_score": 67.895,
      "teaching_point": "Fin count improves drive, but capacitance and leakage decide whether the PPA tradeoff is actually better."
    },
    {
      "simulation_id": "SA-DEV-001-FINFET-FINCOUNT-PPA-001",
      "domain": "device",
      "fins": 3,
      "gate_length_nm": 10,
      "vt_flavor": "SVT",
      "drive_current_ua_proxy": 289.693,
      "gate_cap_ff_proxy": 1.98,
      "leakage_na_proxy": 17.0062,
      "delay_index": 6.83483,
      "ppa_score": 102.6622,
      "teaching_point": "Fin count improves drive, but capacitance and leakage decide whether the PPA tradeoff is actually better."
    },
    {
      "simulation_id": "SA-DEV-001-FINFET-FINCOUNT-PPA-001",
      "domain": "device",
      "fins": 3,
      "gate_length_nm": 14,
      "vt_flavor": "LVT",
      "drive_current_ua_proxy": 311.66,
      "gate_cap_ff_proxy": 2.196,
      "leakage_na_proxy": 44.6157,
      "delay_index": 7.04615,
      "ppa_score": 67.09,
      "teaching_point": "Fin count improves drive, but capacitance and leakage decide whether the PPA tradeoff is actually better."
    },
    {
      "simulation_id": "SA-DEV-001-FINFET-FINCOUNT-PPA-001",
      "domain": "device",
      "fins": 3,
      "gate_length_nm": 14,
      "vt_flavor": "SVT",
      "drive_current_ua_proxy": 251.515,
      "gate_cap_ff_proxy": 2.196,
      "leakage_na_proxy": 11.3567,
      "delay_index": 8.7311,
      "ppa_score": 89.206,
      "teaching_point": "Fin count improves drive, but capacitance and leakage decide whether the PPA tradeoff is actually better."
    },
    {
      "simulation_id": "SA-DEV-001-FINFET-FINCOUNT-PPA-001",
      "domain": "device",
      "fins": 3,
      "gate_length_nm": 18,
      "vt_flavor": "LVT",
      "drive_current_ua_proxy": 280.44,
      "gate_cap_ff_proxy": 2.412,
      "leakage_na_proxy": 33,
      "delay_index": 8.60077,
      "ppa_score": 63.7089,
      "teaching_point": "Fin count improves drive, but capacitance and leakage decide whether the PPA tradeoff is actually better."
    },
    {
      "simulation_id": "SA-DEV-001-FINFET-FINCOUNT-PPA-001",
      "domain": "device",
      "fins": 3,
      "gate_length_nm": 18,
      "vt_flavor": "SVT",
      "drive_current_ua_proxy": 226.32,
      "gate_cap_ff_proxy": 2.412,
      "leakage_na_proxy": 8.4,
      "delay_index": 10.65748,
      "ppa_score": 77.5462,
      "teaching_point": "Fin count improves drive, but capacitance and leakage decide whether the PPA tradeoff is actually better."
    },
    {
      "simulation_id": "SA-DEV-001-FINFET-FINCOUNT-PPA-001",
      "domain": "device",
      "fins": 4,
      "gate_length_nm": 10,
      "vt_flavor": "LVT",
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      "gate_cap_ff_proxy": 2.64,
      "leakage_na_proxy": 89.0799,
      "delay_index": 5.51583,
      "ppa_score": 56.1811,
      "teaching_point": "Fin count improves drive, but capacitance and leakage decide whether the PPA tradeoff is actually better."
    },
    {
      "simulation_id": "SA-DEV-001-FINFET-FINCOUNT-PPA-001",
      "domain": "device",
      "fins": 4,
      "gate_length_nm": 10,
      "vt_flavor": "SVT",
      "drive_current_ua_proxy": 386.257,
      "gate_cap_ff_proxy": 2.64,
      "leakage_na_proxy": 22.6749,
      "delay_index": 6.83483,
      "ppa_score": 93.3767,
      "teaching_point": "Fin count improves drive, but capacitance and leakage decide whether the PPA tradeoff is actually better."
    },
    {
      "simulation_id": "SA-DEV-001-FINFET-FINCOUNT-PPA-001",
      "domain": "device",
      "fins": 4,
      "gate_length_nm": 14,
      "vt_flavor": "LVT",
      "drive_current_ua_proxy": 415.546,
      "gate_cap_ff_proxy": 2.928,
      "leakage_na_proxy": 59.4875,
      "delay_index": 7.04615,
      "ppa_score": 57.061,
      "teaching_point": "Fin count improves drive, but capacitance and leakage decide whether the PPA tradeoff is actually better."
    },
    {
      "simulation_id": "SA-DEV-001-FINFET-FINCOUNT-PPA-001",
      "domain": "device",
      "fins": 4,
      "gate_length_nm": 14,
      "vt_flavor": "SVT",
      "drive_current_ua_proxy": 335.353,
      "gate_cap_ff_proxy": 2.928,
      "leakage_na_proxy": 15.1423,
      "delay_index": 8.7311,
      "ppa_score": 83.0819,
      "teaching_point": "Fin count improves drive, but capacitance and leakage decide whether the PPA tradeoff is actually better."
    },
    {
      "simulation_id": "SA-DEV-001-FINFET-FINCOUNT-PPA-001",
      "domain": "device",
      "fins": 4,
      "gate_length_nm": 18,
      "vt_flavor": "LVT",
      "drive_current_ua_proxy": 373.92,
      "gate_cap_ff_proxy": 3.216,
      "leakage_na_proxy": 44,
      "delay_index": 8.60077,
      "ppa_score": 55.366,
      "teaching_point": "Fin count improves drive, but capacitance and leakage decide whether the PPA tradeoff is actually better."
    },
    {
      "simulation_id": "SA-DEV-001-FINFET-FINCOUNT-PPA-001",
      "domain": "device",
      "fins": 4,
      "gate_length_nm": 18,
      "vt_flavor": "SVT",
      "drive_current_ua_proxy": 301.76,
      "gate_cap_ff_proxy": 3.216,
      "leakage_na_proxy": 11.2,
      "delay_index": 10.65748,
      "ppa_score": 73.3053,
      "teaching_point": "Fin count improves drive, but capacitance and leakage decide whether the PPA tradeoff is actually better."
    }
  ],
  "methods": [
    "Drive current scales with fin count, Vt flavor, and a normalized gate-length factor.",
    "Gate capacitance scales with fin count and gate length.",
    "PPA score divides drive by capacitance and leakage penalty."
  ],
  "limitations": [
    "No calibrated FinFET geometry, source/drain resistance, self-heating, variability, compact model, or measured silicon is included.",
    "No process-node, foundry, or design-rule recommendation is made.",
    "Real device work needs calibrated TCAD, compact models, layout rules, and measured electrical data."
  ],
  "evidence": [
    "v64 deep results store every fin count, gate length, Vt flavor, drive, capacitance, leakage, and score row.",
    "CSV export preserves the PPA comparison table.",
    "The advanced-device lesson links this card to GAA and stress-engineering cards."
  ],
  "sources": [
    {
      "label": "DEVSIM",
      "url": "https://github.com/devsim/devsim",
      "note": "Open device/TCAD candidate for future finite-volume replacement datasets."
    },
    {
      "label": "IEEE IRDS",
      "url": "https://irds.ieee.org/",
      "note": "Roadmap source spine for FinFET, GAA, nanosheet, forksheet, and CFET vocabulary."
    },
    {
      "label": "GAA nanosheet source/drain trimming study",
      "url": "https://pmc.ncbi.nlm.nih.gov/articles/PMC9321815/",
      "note": "Open paper context for GAA nanosheet parasitic RC and source/drain engineering vocabulary."
    }
  ],
  "source_seed_run": "07_assets/factory_lab/experiments/DEEP_SEMICONDUCTOR_V64_2026-08-14/"
}