{ "schema": "semiagora.gan-dynamic-ron-trap-memory.v1", "version": "2026-08-22-v88", "experiment_id": "SA-PWR-GAN-DYNAMIC-RON-003", "slug": "gan-dynamic-ron-trap-memory-replay", "route": "/simulations/gan-dynamic-ron-trap-memory-replay", "lesson_route": "/learn/gan-dynamic-ron-trap-memory", "lab_route": "/labs/gan-dynamic-ron-trap-memory", "title": "GaN dynamic-Ron and trap-memory replay", "execution_mode": "precomputed_browser_csv_replay_only", "counts": { "rows": 5120, "buffer_contexts": 5, "off_state_stress_classes": 4, "drain_bias_classes": 4, "recovery_windows": 4, "temperature_classes": 4, "switching_contexts": 4, "liveServerRuns": 0 }, "source_summary": "JEDEC, open tutorial, arXiv, PowerAmerica, and link-only news/source signals were used for vocabulary and source anchoring only. SemiAgora generated original synthetic teaching rows and did not copy standards text, article bodies, figures, data tables, waveforms, process recipes, product data, TCAD decks, or test scripts.", "sources": [ { "label": "JEDEC JEP173 dynamic on-resistance guideline", "url": "https://www.jedec.org/standards-documents/docs/jep173", "note": "Official source for dynamic ON-resistance measurement-guideline context. SemiAgora uses the public listing as a link-only anchor and does not copy the standard body." }, { "label": "GaN-based power devices tutorial", "url": "https://pubs.aip.org/aip/jap/article/130/18/181101/1025623/GaN-based-power-devices-Physics-reliability-and", "note": "Open tutorial source for GaN power-device physics, reliability, trapping, dynamic Ron, and pulsed-IV vocabulary. No figures, tables, or article body are copied." }, { "label": "OFF-state trapping phenomena in GaN HEMTs", "url": "https://arxiv.org/abs/2107.05934", "note": "Open metadata/source anchor for drain-bias stress, pulsed I-V, threshold shift, Ron change, and trapping-process vocabulary." }, { "label": "Backside insulation and dynamic on-resistance in p-GaN HEMTs", "url": "https://arxiv.org/abs/2406.08701", "note": "Open metadata/source anchor for substrate/backside context, double-pulse testing, DC stress, and reliability tradeoff vocabulary." }, { "label": "PowerAmerica wide-bandgap short course", "url": "https://poweramericainstitute.org/2026-short-course/", "note": "Public education source for SiC/GaN, wide-bandgap devices, reliability, and mission-profile vocabulary." }, { "label": "TekSiC semi-insulating SiC wafer signal", "url": "https://semiconductor-today.com/news_items/2026/aug/teksic-200826.shtml", "note": "Daily link-only supplier/news signal reinforcing semi-insulating SiC context. Title-level citation only; no supplier claims or process details are copied." } ], "axes": { "buffer_contexts": [ { "id": "semi_insulating_sic_buffer_reference", "label": "Semi-insulating SiC buffer reference" }, { "id": "gan_on_si_buffer_watch", "label": "GaN-on-Si buffer watch" }, { "id": "carbon_doped_buffer_memory_watch", "label": "Carbon-doped buffer memory watch" }, { "id": "pgan_gate_power_hemt_watch", "label": "p-GaN gate power HEMT watch" }, { "id": "bonded_gan_sic_interface_watch", "label": "Bonded GaN-SiC interface watch" } ], "off_state_stress_classes": [ { "id": "low_field_short_soak", "label": "Low-field short soak" }, { "id": "nominal_blocking_soak", "label": "Nominal blocking soak" }, { "id": "high_field_long_soak", "label": "High-field long soak" }, { "id": "near_limit_watch_soak", "label": "Near-limit watch soak" } ], "drain_bias_classes": [ { "id": "low_vds_memory_probe", "label": "Low VDS memory probe" }, { "id": "medium_vds_blocking", "label": "Medium VDS blocking" }, { "id": "high_vds_blocking", "label": "High VDS blocking" }, { "id": "overstress_watch", "label": "Overstress watch" } ], "recovery_windows": [ { "id": "sub_microsecond_readout", "label": "Sub-microsecond readout" }, { "id": "microsecond_memory_window", "label": "Microsecond memory window" }, { "id": "millisecond_recovery_window", "label": "Millisecond recovery window" }, { "id": "long_recovery_reference", "label": "Long recovery reference" } ], "temperature_classes": [ { "id": "room_temp_reference", "label": "Room-temperature reference" }, { "id": "warm_operation_watch", "label": "Warm operation watch" }, { "id": "hot_case_watch", "label": "Hot case watch" }, { "id": "thermal_stress_boundary", "label": "Thermal stress boundary" } ], "switching_contexts": [ { "id": "pulsed_iv_characterization", "label": "Pulsed I-V characterization" }, { "id": "soft_switching_converter_watch", "label": "Soft-switching converter watch" }, { "id": "hard_switching_converter_watch", "label": "Hard-switching converter watch" }, { "id": "off_state_storage_watch", "label": "Off-state storage watch" } ] }, "decision_gate_counts": { "recovery_window_review": 243, "measurement_method_review": 1957, "bounded_teaching_candidate": 247, "reference_bounded_case": 1, "thermal_risk_review": 29, "trap_memory_review": 153, "switching_context_review": 3, "qualification_evidence_required": 2487 }, "average_dynamic_ron_by_buffer": [ { "buffer_context": "semi_insulating_sic_buffer_reference", "label": "Semi-insulating SiC buffer reference", "dynamic_ron_ratio": "1.707" }, { "buffer_context": "gan_on_si_buffer_watch", "label": "GaN-on-Si buffer watch", "dynamic_ron_ratio": "1.831" }, { "buffer_context": "carbon_doped_buffer_memory_watch", "label": "Carbon-doped buffer memory watch", "dynamic_ron_ratio": "1.901" }, { "buffer_context": "pgan_gate_power_hemt_watch", "label": "p-GaN gate power HEMT watch", "dynamic_ron_ratio": "1.850" }, { "buffer_context": "bonded_gan_sic_interface_watch", "label": "Bonded GaN-SiC interface watch", "dynamic_ron_ratio": "1.798" } ], "average_trap_memory_by_buffer": [ { "buffer_context": "semi_insulating_sic_buffer_reference", "label": "Semi-insulating SiC buffer reference", "trap_memory_proxy": "0.707" }, { "buffer_context": "gan_on_si_buffer_watch", "label": "GaN-on-Si buffer watch", "trap_memory_proxy": "0.834" }, { "buffer_context": "carbon_doped_buffer_memory_watch", "label": "Carbon-doped buffer memory watch", "trap_memory_proxy": "0.909" }, { "buffer_context": "pgan_gate_power_hemt_watch", "label": "p-GaN gate power HEMT watch", "trap_memory_proxy": "0.855" }, { "buffer_context": "bonded_gan_sic_interface_watch", "label": "Bonded GaN-SiC interface watch", "trap_memory_proxy": "0.802" } ], "shortlist_examples": [ { "case_id": "GAN_DRON_0033", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "low_vds_memory_probe", "drain_bias_label": "Low VDS memory probe", "recovery_window": "millisecond_recovery_window", "recovery_window_label": "Millisecond recovery window", "temperature_class": "room_temp_reference", "temperature_label": "Room-temperature reference", "switching_context": "pulsed_iv_characterization", "switching_context_label": "Pulsed I-V characterization", "trap_memory_proxy": "0.284", "dynamic_ron_ratio": "1.220", "current_collapse_proxy": "0.163", "recovery_score": "0.328", "thermal_risk_proxy": "0.126", "switching_loss_pressure": "0.194", "measurement_caution_score": "0.528", "evidence_maturity_score": "0.748", "decision_gate": "bounded_teaching_candidate", "evidence_state": "synthetic_teaching_proxy", "next_safe_check": "Keep stress class, recovery window, dynamic-Ron ratio, and current-collapse proxy together before narrowing.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" }, { "case_id": "GAN_DRON_0034", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "low_vds_memory_probe", "drain_bias_label": "Low VDS memory probe", "recovery_window": "millisecond_recovery_window", "recovery_window_label": "Millisecond recovery window", "temperature_class": "room_temp_reference", "temperature_label": "Room-temperature reference", "switching_context": "soft_switching_converter_watch", "switching_context_label": "Soft-switching converter watch", "trap_memory_proxy": "0.296", "dynamic_ron_ratio": "1.242", "current_collapse_proxy": "0.191", "recovery_score": "0.323", "thermal_risk_proxy": "0.149", "switching_loss_pressure": "0.229", "measurement_caution_score": "0.608", "evidence_maturity_score": "0.631", "decision_gate": "bounded_teaching_candidate", "evidence_state": "synthetic_teaching_proxy", "next_safe_check": "Keep stress class, recovery window, dynamic-Ron ratio, and current-collapse proxy together before narrowing.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" }, { "case_id": "GAN_DRON_0036", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "low_vds_memory_probe", "drain_bias_label": "Low VDS memory probe", "recovery_window": "millisecond_recovery_window", "recovery_window_label": "Millisecond recovery window", "temperature_class": "room_temp_reference", "temperature_label": "Room-temperature reference", "switching_context": "off_state_storage_watch", "switching_context_label": "Off-state storage watch", "trap_memory_proxy": "0.290", "dynamic_ron_ratio": "1.226", "current_collapse_proxy": "0.163", "recovery_score": "0.325", "thermal_risk_proxy": "0.137", "switching_loss_pressure": "0.210", "measurement_caution_score": "0.588", "evidence_maturity_score": "0.616", "decision_gate": "bounded_teaching_candidate", "evidence_state": "synthetic_teaching_proxy", "next_safe_check": "Keep stress class, recovery window, dynamic-Ron ratio, and current-collapse proxy together before narrowing.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" }, { "case_id": "GAN_DRON_0037", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "low_vds_memory_probe", "drain_bias_label": "Low VDS memory probe", "recovery_window": "millisecond_recovery_window", "recovery_window_label": "Millisecond recovery window", "temperature_class": "warm_operation_watch", "temperature_label": "Warm operation watch", "switching_context": "pulsed_iv_characterization", "switching_context_label": "Pulsed I-V characterization", "trap_memory_proxy": "0.324", "dynamic_ron_ratio": "1.276", "current_collapse_proxy": "0.184", "recovery_score": "0.329", "thermal_risk_proxy": "0.329", "switching_loss_pressure": "0.258", "measurement_caution_score": "0.542", "evidence_maturity_score": "0.738", "decision_gate": "bounded_teaching_candidate", "evidence_state": "synthetic_teaching_proxy", "next_safe_check": "Keep stress class, recovery window, dynamic-Ron ratio, and current-collapse proxy together before narrowing.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" }, { "case_id": "GAN_DRON_0038", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "low_vds_memory_probe", "drain_bias_label": "Low VDS memory probe", "recovery_window": "millisecond_recovery_window", "recovery_window_label": "Millisecond recovery window", "temperature_class": "warm_operation_watch", "temperature_label": "Warm operation watch", "switching_context": "soft_switching_converter_watch", "switching_context_label": "Soft-switching converter watch", "trap_memory_proxy": "0.336", "dynamic_ron_ratio": "1.298", "current_collapse_proxy": "0.212", "recovery_score": "0.324", "thermal_risk_proxy": "0.353", "switching_loss_pressure": "0.293", "measurement_caution_score": "0.622", "evidence_maturity_score": "0.621", "decision_gate": "bounded_teaching_candidate", "evidence_state": "synthetic_teaching_proxy", "next_safe_check": "Keep stress class, recovery window, dynamic-Ron ratio, and current-collapse proxy together before narrowing.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" }, { "case_id": "GAN_DRON_0040", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "low_vds_memory_probe", "drain_bias_label": "Low VDS memory probe", "recovery_window": "millisecond_recovery_window", "recovery_window_label": "Millisecond recovery window", "temperature_class": "warm_operation_watch", "temperature_label": "Warm operation watch", "switching_context": "off_state_storage_watch", "switching_context_label": "Off-state storage watch", "trap_memory_proxy": "0.330", "dynamic_ron_ratio": "1.282", "current_collapse_proxy": "0.184", "recovery_score": "0.327", "thermal_risk_proxy": "0.340", "switching_loss_pressure": "0.274", "measurement_caution_score": "0.602", "evidence_maturity_score": "0.606", "decision_gate": "bounded_teaching_candidate", "evidence_state": "synthetic_teaching_proxy", "next_safe_check": "Keep stress class, recovery window, dynamic-Ron ratio, and current-collapse proxy together before narrowing.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" }, { "case_id": "GAN_DRON_0041", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "low_vds_memory_probe", "drain_bias_label": "Low VDS memory probe", "recovery_window": "millisecond_recovery_window", "recovery_window_label": "Millisecond recovery window", "temperature_class": "hot_case_watch", "temperature_label": "Hot case watch", "switching_context": "pulsed_iv_characterization", "switching_context_label": "Pulsed I-V characterization", "trap_memory_proxy": "0.384", "dynamic_ron_ratio": "1.355", "current_collapse_proxy": "0.215", "recovery_score": "0.327", "thermal_risk_proxy": "0.575", "switching_loss_pressure": "0.343", "measurement_caution_score": "0.570", "evidence_maturity_score": "0.722", "decision_gate": "bounded_teaching_candidate", "evidence_state": "synthetic_teaching_proxy", "next_safe_check": "Keep stress class, recovery window, dynamic-Ron ratio, and current-collapse proxy together before narrowing.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" }, { "case_id": "GAN_DRON_0042", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "low_vds_memory_probe", "drain_bias_label": "Low VDS memory probe", "recovery_window": "millisecond_recovery_window", "recovery_window_label": "Millisecond recovery window", "temperature_class": "hot_case_watch", "temperature_label": "Hot case watch", "switching_context": "soft_switching_converter_watch", "switching_context_label": "Soft-switching converter watch", "trap_memory_proxy": "0.396", "dynamic_ron_ratio": "1.376", "current_collapse_proxy": "0.243", "recovery_score": "0.322", "thermal_risk_proxy": "0.598", "switching_loss_pressure": "0.378", "measurement_caution_score": "0.650", "evidence_maturity_score": "0.606", "decision_gate": "bounded_teaching_candidate", "evidence_state": "synthetic_teaching_proxy", "next_safe_check": "Keep stress class, recovery window, dynamic-Ron ratio, and current-collapse proxy together before narrowing.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" } ], "trap_limited_examples": [ { "case_id": "GAN_DRON_0137", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "high_vds_blocking", "drain_bias_label": "High VDS blocking", "recovery_window": "sub_microsecond_readout", "recovery_window_label": "Sub-microsecond readout", "temperature_class": "hot_case_watch", "temperature_label": "Hot case watch", "switching_context": "pulsed_iv_characterization", "switching_context_label": "Pulsed I-V characterization", "trap_memory_proxy": "0.595", "dynamic_ron_ratio": "1.628", "current_collapse_proxy": "0.407", "recovery_score": "0.000", "thermal_risk_proxy": "0.610", "switching_loss_pressure": "0.538", "measurement_caution_score": "0.710", "evidence_maturity_score": "0.631", "decision_gate": "trap_memory_review", "evidence_state": "needs_owned_pulsed_iv_data", "next_safe_check": "Require owned pulsed I-V or double-pulse evidence before trusting the dynamic-Ron ratio.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" }, { "case_id": "GAN_DRON_0157", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "high_vds_blocking", "drain_bias_label": "High VDS blocking", "recovery_window": "microsecond_memory_window", "recovery_window_label": "Microsecond memory window", "temperature_class": "thermal_stress_boundary", "temperature_label": "Thermal stress boundary", "switching_context": "pulsed_iv_characterization", "switching_context_label": "Pulsed I-V characterization", "trap_memory_proxy": "0.648", "dynamic_ron_ratio": "1.683", "current_collapse_proxy": "0.420", "recovery_score": "0.036", "thermal_risk_proxy": "0.792", "switching_loss_pressure": "0.599", "measurement_caution_score": "0.665", "evidence_maturity_score": "0.642", "decision_gate": "trap_memory_review", "evidence_state": "needs_owned_pulsed_iv_data", "next_safe_check": "Require owned pulsed I-V or double-pulse evidence before trusting the dynamic-Ron ratio.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" }, { "case_id": "GAN_DRON_0160", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "high_vds_blocking", "drain_bias_label": "High VDS blocking", "recovery_window": "microsecond_memory_window", "recovery_window_label": "Microsecond memory window", "temperature_class": "thermal_stress_boundary", "temperature_label": "Thermal stress boundary", "switching_context": "off_state_storage_watch", "switching_context_label": "Off-state storage watch", "trap_memory_proxy": "0.655", "dynamic_ron_ratio": "1.689", "current_collapse_proxy": "0.420", "recovery_score": "0.034", "thermal_risk_proxy": "0.803", "switching_loss_pressure": "0.615", "measurement_caution_score": "0.725", "evidence_maturity_score": "0.510", "decision_gate": "trap_memory_review", "evidence_state": "needs_owned_pulsed_iv_data", "next_safe_check": "Require owned pulsed I-V or double-pulse evidence before trusting the dynamic-Ron ratio.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" }, { "case_id": "GAN_DRON_0174", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "high_vds_blocking", "drain_bias_label": "High VDS blocking", "recovery_window": "millisecond_recovery_window", "recovery_window_label": "Millisecond recovery window", "temperature_class": "thermal_stress_boundary", "temperature_label": "Thermal stress boundary", "switching_context": "soft_switching_converter_watch", "switching_context_label": "Soft-switching converter watch", "trap_memory_proxy": "0.626", "dynamic_ron_ratio": "1.630", "current_collapse_proxy": "0.411", "recovery_score": "0.255", "thermal_risk_proxy": "0.808", "switching_loss_pressure": "0.582", "measurement_caution_score": "0.685", "evidence_maturity_score": "0.558", "decision_gate": "trap_memory_review", "evidence_state": "needs_owned_pulsed_iv_data", "next_safe_check": "Require owned pulsed I-V or double-pulse evidence before trusting the dynamic-Ron ratio.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" }, { "case_id": "GAN_DRON_0197", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "overstress_watch", "drain_bias_label": "Overstress watch", "recovery_window": "sub_microsecond_readout", "recovery_window_label": "Sub-microsecond readout", "temperature_class": "warm_operation_watch", "temperature_label": "Warm operation watch", "switching_context": "pulsed_iv_characterization", "switching_context_label": "Pulsed I-V characterization", "trap_memory_proxy": "0.608", "dynamic_ron_ratio": "1.626", "current_collapse_proxy": "0.444", "recovery_score": "0.000", "thermal_risk_proxy": "0.376", "switching_loss_pressure": "0.508", "measurement_caution_score": "0.682", "evidence_maturity_score": "0.634", "decision_gate": "trap_memory_review", "evidence_state": "needs_owned_pulsed_iv_data", "next_safe_check": "Require owned pulsed I-V or double-pulse evidence before trusting the dynamic-Ron ratio.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" }, { "case_id": "GAN_DRON_0217", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "overstress_watch", "drain_bias_label": "Overstress watch", "recovery_window": "microsecond_memory_window", "recovery_window_label": "Microsecond memory window", "temperature_class": "hot_case_watch", "temperature_label": "Hot case watch", "switching_context": "pulsed_iv_characterization", "switching_context_label": "Pulsed I-V characterization", "trap_memory_proxy": "0.641", "dynamic_ron_ratio": "1.672", "current_collapse_proxy": "0.447", "recovery_score": "0.023", "thermal_risk_proxy": "0.617", "switching_loss_pressure": "0.569", "measurement_caution_score": "0.630", "evidence_maturity_score": "0.649", "decision_gate": "trap_memory_review", "evidence_state": "needs_owned_pulsed_iv_data", "next_safe_check": "Require owned pulsed I-V or double-pulse evidence before trusting the dynamic-Ron ratio.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" }, { "case_id": "GAN_DRON_0218", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "overstress_watch", "drain_bias_label": "Overstress watch", "recovery_window": "microsecond_memory_window", "recovery_window_label": "Microsecond memory window", "temperature_class": "hot_case_watch", "temperature_label": "Hot case watch", "switching_context": "soft_switching_converter_watch", "switching_context_label": "Soft-switching converter watch", "trap_memory_proxy": "0.654", "dynamic_ron_ratio": "1.694", "current_collapse_proxy": "0.476", "recovery_score": "0.018", "thermal_risk_proxy": "0.640", "switching_loss_pressure": "0.605", "measurement_caution_score": "0.710", "evidence_maturity_score": "0.532", "decision_gate": "trap_memory_review", "evidence_state": "needs_owned_pulsed_iv_data", "next_safe_check": "Require owned pulsed I-V or double-pulse evidence before trusting the dynamic-Ron ratio.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" }, { "case_id": "GAN_DRON_0220", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "overstress_watch", "drain_bias_label": "Overstress watch", "recovery_window": "microsecond_memory_window", "recovery_window_label": "Microsecond memory window", "temperature_class": "hot_case_watch", "temperature_label": "Hot case watch", "switching_context": "off_state_storage_watch", "switching_context_label": "Off-state storage watch", "trap_memory_proxy": "0.648", "dynamic_ron_ratio": "1.678", "current_collapse_proxy": "0.447", "recovery_score": "0.020", "thermal_risk_proxy": "0.628", "switching_loss_pressure": "0.586", "measurement_caution_score": "0.690", "evidence_maturity_score": "0.517", "decision_gate": "trap_memory_review", "evidence_state": "needs_owned_pulsed_iv_data", "next_safe_check": "Require owned pulsed I-V or double-pulse evidence before trusting the dynamic-Ron ratio.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" }, { "case_id": "GAN_DRON_0237", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "overstress_watch", "drain_bias_label": "Overstress watch", "recovery_window": "millisecond_recovery_window", "recovery_window_label": "Millisecond recovery window", "temperature_class": "thermal_stress_boundary", "temperature_label": "Thermal stress boundary", "switching_context": "pulsed_iv_characterization", "switching_context_label": "Pulsed I-V characterization", "trap_memory_proxy": "0.686", "dynamic_ron_ratio": "1.690", "current_collapse_proxy": "0.452", "recovery_score": "0.234", "thermal_risk_proxy": "0.798", "switching_loss_pressure": "0.604", "measurement_caution_score": "0.605", "evidence_maturity_score": "0.662", "decision_gate": "trap_memory_review", "evidence_state": "needs_owned_pulsed_iv_data", "next_safe_check": "Require owned pulsed I-V or double-pulse evidence before trusting the dynamic-Ron ratio.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" }, { "case_id": "GAN_DRON_0240", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "overstress_watch", "drain_bias_label": "Overstress watch", "recovery_window": "millisecond_recovery_window", "recovery_window_label": "Millisecond recovery window", "temperature_class": "thermal_stress_boundary", "temperature_label": "Thermal stress boundary", "switching_context": "off_state_storage_watch", "switching_context_label": "Off-state storage watch", "trap_memory_proxy": "0.692", "dynamic_ron_ratio": "1.696", "current_collapse_proxy": "0.451", "recovery_score": "0.232", "thermal_risk_proxy": "0.808", "switching_loss_pressure": "0.620", "measurement_caution_score": "0.665", "evidence_maturity_score": "0.530", "decision_gate": "trap_memory_review", "evidence_state": "needs_owned_pulsed_iv_data", "next_safe_check": "Require owned pulsed I-V or double-pulse evidence before trusting the dynamic-Ron ratio.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" }, { "case_id": "GAN_DRON_0254", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "overstress_watch", "drain_bias_label": "Overstress watch", "recovery_window": "long_recovery_reference", "recovery_window_label": "Long recovery reference", "temperature_class": "thermal_stress_boundary", "temperature_label": "Thermal stress boundary", "switching_context": "soft_switching_converter_watch", "switching_context_label": "Soft-switching converter watch", "trap_memory_proxy": "0.659", "dynamic_ron_ratio": "1.629", "current_collapse_proxy": "0.438", "recovery_score": "0.475", "thermal_risk_proxy": "0.813", "switching_loss_pressure": "0.580", "measurement_caution_score": "0.645", "evidence_maturity_score": "0.577", "decision_gate": "trap_memory_review", "evidence_state": "needs_owned_pulsed_iv_data", "next_safe_check": "Require owned pulsed I-V or double-pulse evidence before trusting the dynamic-Ron ratio.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" }, { "case_id": "GAN_DRON_0285", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "nominal_blocking_soak", "off_state_stress_label": "Nominal blocking soak", "drain_bias_class": "low_vds_memory_probe", "drain_bias_label": "Low VDS memory probe", "recovery_window": "microsecond_memory_window", "recovery_window_label": "Microsecond memory window", "temperature_class": "thermal_stress_boundary", "temperature_label": "Thermal stress boundary", "switching_context": "pulsed_iv_characterization", "switching_context_label": "Pulsed I-V characterization", "trap_memory_proxy": "0.619", "dynamic_ron_ratio": "1.653", "current_collapse_proxy": "0.393", "recovery_score": "0.031", "thermal_risk_proxy": "0.787", "switching_loss_pressure": "0.577", "measurement_caution_score": "0.725", "evidence_maturity_score": "0.636", "decision_gate": "trap_memory_review", "evidence_state": "needs_owned_pulsed_iv_data", "next_safe_check": "Require owned pulsed I-V or double-pulse evidence before trusting the dynamic-Ron ratio.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" } ], "method_review_examples": [ { "case_id": "GAN_DRON_0002", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "low_vds_memory_probe", "drain_bias_label": "Low VDS memory probe", "recovery_window": "sub_microsecond_readout", "recovery_window_label": "Sub-microsecond readout", "temperature_class": "room_temp_reference", "temperature_label": "Room-temperature reference", "switching_context": "soft_switching_converter_watch", "switching_context_label": "Soft-switching converter watch", "trap_memory_proxy": "0.358", "dynamic_ron_ratio": "1.361", "current_collapse_proxy": "0.257", "recovery_score": "0.000", "thermal_risk_proxy": "0.161", "switching_loss_pressure": "0.315", "measurement_caution_score": "0.748", "evidence_maturity_score": "0.567", "decision_gate": "measurement_method_review", "evidence_state": "needs_method_and_probe_review", "next_safe_check": "Review clamp timing, readout delay, noise floor, and method boundary before comparing rows.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" }, { "case_id": "GAN_DRON_0003", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "low_vds_memory_probe", "drain_bias_label": "Low VDS memory probe", "recovery_window": "sub_microsecond_readout", "recovery_window_label": "Sub-microsecond readout", "temperature_class": "room_temp_reference", "temperature_label": "Room-temperature reference", "switching_context": "hard_switching_converter_watch", "switching_context_label": "Hard-switching converter watch", "trap_memory_proxy": "0.384", "dynamic_ron_ratio": "1.399", "current_collapse_proxy": "0.303", "recovery_score": "0.000", "thermal_risk_proxy": "0.198", "switching_loss_pressure": "0.374", "measurement_caution_score": "0.868", "evidence_maturity_score": "0.481", "decision_gate": "measurement_method_review", "evidence_state": "needs_method_and_probe_review", "next_safe_check": "Review clamp timing, readout delay, noise floor, and method boundary before comparing rows.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" }, { "case_id": "GAN_DRON_0006", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "low_vds_memory_probe", "drain_bias_label": "Low VDS memory probe", "recovery_window": "sub_microsecond_readout", "recovery_window_label": "Sub-microsecond readout", "temperature_class": "warm_operation_watch", "temperature_label": "Warm operation watch", "switching_context": "soft_switching_converter_watch", "switching_context_label": "Soft-switching converter watch", "trap_memory_proxy": "0.398", "dynamic_ron_ratio": "1.417", "current_collapse_proxy": "0.278", "recovery_score": "0.000", "thermal_risk_proxy": "0.364", "switching_loss_pressure": "0.379", "measurement_caution_score": "0.762", "evidence_maturity_score": "0.557", "decision_gate": "measurement_method_review", "evidence_state": "needs_method_and_probe_review", "next_safe_check": "Review clamp timing, readout delay, noise floor, and method boundary before comparing rows.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" }, { "case_id": "GAN_DRON_0007", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "low_vds_memory_probe", "drain_bias_label": "Low VDS memory probe", "recovery_window": "sub_microsecond_readout", "recovery_window_label": "Sub-microsecond readout", "temperature_class": "warm_operation_watch", "temperature_label": "Warm operation watch", "switching_context": "hard_switching_converter_watch", "switching_context_label": "Hard-switching converter watch", "trap_memory_proxy": "0.424", "dynamic_ron_ratio": "1.455", "current_collapse_proxy": "0.323", "recovery_score": "0.000", "thermal_risk_proxy": "0.401", "switching_loss_pressure": "0.438", "measurement_caution_score": "0.882", "evidence_maturity_score": "0.471", "decision_gate": "measurement_method_review", "evidence_state": "needs_method_and_probe_review", "next_safe_check": "Review clamp timing, readout delay, noise floor, and method boundary before comparing rows.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" }, { "case_id": "GAN_DRON_0008", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "low_vds_memory_probe", "drain_bias_label": "Low VDS memory probe", "recovery_window": "sub_microsecond_readout", "recovery_window_label": "Sub-microsecond readout", "temperature_class": "warm_operation_watch", "temperature_label": "Warm operation watch", "switching_context": "off_state_storage_watch", "switching_context_label": "Off-state storage watch", "trap_memory_proxy": "0.392", "dynamic_ron_ratio": "1.402", "current_collapse_proxy": "0.249", "recovery_score": "0.000", "thermal_risk_proxy": "0.352", "switching_loss_pressure": "0.360", "measurement_caution_score": "0.742", "evidence_maturity_score": "0.542", "decision_gate": "measurement_method_review", "evidence_state": "needs_method_and_probe_review", "next_safe_check": "Review clamp timing, readout delay, noise floor, and method boundary before comparing rows.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" }, { "case_id": "GAN_DRON_0010", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "low_vds_memory_probe", "drain_bias_label": "Low VDS memory probe", "recovery_window": "sub_microsecond_readout", "recovery_window_label": "Sub-microsecond readout", "temperature_class": "hot_case_watch", "temperature_label": "Hot case watch", "switching_context": "soft_switching_converter_watch", "switching_context_label": "Soft-switching converter watch", "trap_memory_proxy": "0.458", "dynamic_ron_ratio": "1.496", "current_collapse_proxy": "0.309", "recovery_score": "0.000", "thermal_risk_proxy": "0.610", "switching_loss_pressure": "0.464", "measurement_caution_score": "0.790", "evidence_maturity_score": "0.541", "decision_gate": "measurement_method_review", "evidence_state": "needs_method_and_probe_review", "next_safe_check": "Review clamp timing, readout delay, noise floor, and method boundary before comparing rows.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" }, { "case_id": "GAN_DRON_0011", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "low_vds_memory_probe", "drain_bias_label": "Low VDS memory probe", "recovery_window": "sub_microsecond_readout", "recovery_window_label": "Sub-microsecond readout", "temperature_class": "hot_case_watch", "temperature_label": "Hot case watch", "switching_context": "hard_switching_converter_watch", "switching_context_label": "Hard-switching converter watch", "trap_memory_proxy": "0.484", "dynamic_ron_ratio": "1.533", "current_collapse_proxy": "0.355", "recovery_score": "0.000", "thermal_risk_proxy": "0.647", "switching_loss_pressure": "0.523", "measurement_caution_score": "0.910", "evidence_maturity_score": "0.455", "decision_gate": "measurement_method_review", "evidence_state": "needs_method_and_probe_review", "next_safe_check": "Review clamp timing, readout delay, noise floor, and method boundary before comparing rows.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" }, { "case_id": "GAN_DRON_0012", "buffer_context": "semi_insulating_sic_buffer_reference", "buffer_label": "Semi-insulating SiC buffer reference", "off_state_stress_class": "low_field_short_soak", "off_state_stress_label": "Low-field short soak", "drain_bias_class": "low_vds_memory_probe", "drain_bias_label": "Low VDS memory probe", "recovery_window": "sub_microsecond_readout", "recovery_window_label": "Sub-microsecond readout", "temperature_class": "hot_case_watch", "temperature_label": "Hot case watch", "switching_context": "off_state_storage_watch", "switching_context_label": "Off-state storage watch", "trap_memory_proxy": "0.452", "dynamic_ron_ratio": "1.480", "current_collapse_proxy": "0.280", "recovery_score": "0.000", "thermal_risk_proxy": "0.598", "switching_loss_pressure": "0.445", "measurement_caution_score": "0.770", "evidence_maturity_score": "0.526", "decision_gate": "measurement_method_review", "evidence_state": "needs_method_and_probe_review", "next_safe_check": "Review clamp timing, readout delay, noise floor, and method boundary before comparing rows.", "buffer_note": "extends the live v83 substrate-chain reference without ranking a supplier" } ], "role_views": [ { "role": "device characterization", "reads": [ "off_state_stress_class", "recovery_window", "dynamic_ron_ratio", "measurement_caution_score" ], "question": "Is the apparent Ron movement a device behavior, a readout-window artifact, or a method boundary?" }, { "role": "power electronics", "reads": [ "switching_context", "current_collapse_proxy", "switching_loss_pressure", "thermal_risk_proxy" ], "question": "Does the switching context change loss pressure before any converter claim is reused?" }, { "role": "reliability", "reads": [ "trap_memory_proxy", "evidence_maturity_score", "decision_gate", "next_safe_check" ], "question": "Which owned pulsed, thermal, stress, and aging evidence is missing before qualification language appears?" }, { "role": "source governance", "reads": [ "buffer_context", "evidence_state", "source_summary", "public_boundary" ], "question": "Can the row stay link-first and synthetic, without copying standards, product data, or recipes?" } ], "public_boundary": [ "No JEDEC standard body, article body, figure, waveform, test script, product data, supplier process detail, or measurement table is copied.", "No live TCAD, SPICE, RF, electrothermal, double-pulse, or server-side solver is active.", "No wafer recipe, epitaxy condition, package recommendation, supplier ranking, device qualification, reliability signoff, product recommendation, or public service intake is enabled.", "Rows are synthetic teaching proxies and require owned pulsed I-V, switching waveform, thermal, package, aging, and device-owner evidence before engineering reuse." ] }