{ "schema": "semiagora.probe-test-public-manifest.v1", "version": "2026-08-30-probe-test-packet-v1", "packetVersion": "2026-08-30-probe-test-v1", "experimentId": "SA-TEST-PROBE-039", "generatedAt": "2026-08-30T00:00:00+09:00", "status": "packet-only-not-deployed", "counts": { "rows": 5760, "physicalRows": 2880, "evidencePairs": 2880, "evidencePairComparisons": 547200, "columns": 192, "sources": 20, "claimNodes": 16, "normalizedProxyEquations": 20, "exactIntegerLedgerEquations": 16, "exactIntegerLedgers": 3, "prohibitedZeroFields": 112 }, "axes": [ { "id": "probe_test_family", "count": 3, "values": [ "wafer-prober-like", "probe-card-like", "thermal-chuck-like" ], "meaning": "Categorical wafer-prober, probe-card, or thermal-chuck review family only; not a supplier, model, serial, device, geometry, setting, recipe, qualification, or production route." }, { "id": "contact_mechanics_state", "count": 5, "values": [ "force-constrained-like", "overdrive-constrained-like", "needle-pad-interaction-limited-like", "alignment-repeatability-limited-like", "contact-mechanics-supported-like" ], "meaning": "Categorical contact-force, overdrive, needle-pad interaction, alignment, and repeatability evidence posture only; not a physical value, command, limit, or result." }, { "id": "contact_resistance_state", "count": 3, "values": [ "contact-resistance-constrained-like", "contact-stability-review-like", "contact-resistance-supported-like" ], "meaning": "Categorical contact-resistance and stability evidence posture only; not resistance, current, voltage, cleaning count, pass/fail, or disposition." }, { "id": "parasitic_state", "count": 2, "values": [ "parasitic-constrained-like", "parasitic-supported-like" ], "meaning": "Categorical parasitic and RF-calibration evidence posture only; not capacitance, inductance, impedance, frequency, fixture, calibration value, or result." }, { "id": "temperature_context_state", "count": 2, "values": [ "temperature-context-constrained-like", "temperature-context-supported-like" ], "meaning": "Categorical chuck and elevated-temperature evidence posture only; not a temperature, setpoint, soak, drift, test limit, or operating instruction." }, { "id": "retest_coverage_state", "count": 2, "values": [ "retest-false-fail-constrained-like", "coverage-evidence-supported-like" ], "meaning": "Categorical retest, false-fail, coverage, and replacement-evidence posture only; not a retest trigger, test reduction, threshold, pass/fail, or release decision." }, { "id": "ordered_probe_state", "count": 8, "values": [ "probe-state-a", "probe-state-b", "probe-state-c", "probe-state-d", "probe-state-e", "probe-state-f", "probe-state-g", "probe-state-h" ], "meaning": "Deterministic teaching sweep index only; not time, wafer position, die identity, touchdown count, probe route, sequence, equipment history, or production state." }, { "id": "evidence_posture", "count": 2, "values": [ "teaching_assumption", "replacement_slot" ], "meaning": "Paired evidence posture; replacement_slot changes evidence ownership only and must preserve every categorical, proxy, ledger, role, bridge, and physical identity." } ], "ranges": { "ordered_probe_state_norm": { "min": 0, "max": 1 }, "family_context_readiness_proxy": { "min": 0.5188, "max": 0.805542857 }, "contact_mechanics_readiness_proxy": { "min": 0.4426, "max": 0.813171429 }, "contact_resistance_readiness_proxy": { "min": 0.4052, "max": 0.7932 }, "parasitic_readiness_proxy": { "min": 0.4376, "max": 0.803885714 }, "temperature_context_readiness_proxy": { "min": 0.4306, "max": 0.819742857 }, "retest_false_fail_readiness_proxy": { "min": 0.412, "max": 0.7432 }, "coverage_evidence_readiness_proxy": { "min": 0.45144, "max": 0.751469714 }, "measurement_traceability_readiness_proxy": { "min": 0.5072, "max": 0.798685714 }, "contact_instability_burden_proxy": { "min": 0.226342857, "max": 0.6252 }, "parasitic_uncertainty_burden_proxy": { "min": 0.270114286, "max": 0.6056 }, "thermal_drift_burden_proxy": { "min": 0.2296, "max": 0.628 }, "false_fail_burden_proxy": { "min": 0.301714286, "max": 0.6716 }, "coverage_gap_burden_proxy": { "min": 0.277731429, "max": 0.55408 }, "calibration_readiness_proxy": { "min": 0.478344, "max": 0.777363429 }, "equipment_state_readiness_proxy": { "min": 0.488, "max": 0.817314286 }, "substrate_map_traceability_proxy": { "min": 0.542888, "max": 0.807914286 }, "model_limit_burden_proxy": { "min": 0.283707429, "max": 0.695216 }, "probe_test_review_readiness_proxy": { "min": 0.52325664, "max": 0.83859392 }, "downstream_handoff_readiness_proxy": { "min": 0.511637389, "max": 0.801810449 } }, "distributions": { "probeTestRegime": { "contact-mechanics-limited": 3452, "contact-resistance-limited": 800, "parasitic-limited": 752, "temperature-context-limited": 376, "bounded-probe-test-review": 182, "retest-false-fail-limited": 184, "coverage-evidence-limited": 10, "probe-test-family-context-limited": 4 }, "labels": { 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"wafer-prober-like|needle-pad-interaction-limited-like|contact-stability-review-like|parasitic-supported-like|temperature-context-supported-like|coverage-evidence-supported-like|probe-state-b", "probe_test_family": "wafer-prober-like", "contact_mechanics_state": "needle-pad-interaction-limited-like", "contact_resistance_state": "contact-stability-review-like", "parasitic_state": "parasitic-supported-like", "temperature_context_state": "temperature-context-supported-like", "retest_coverage_state": "coverage-evidence-supported-like", "ordered_probe_state": "probe-state-b", "evidence_posture": "teaching_assumption", "probe_test_regime": "bounded-probe-test-review", "ordered_probe_state_norm": 0.142857143, "family_context_readiness_proxy": 0.701714286, "contact_mechanics_readiness_proxy": 0.563685714, "contact_resistance_readiness_proxy": 0.574, "parasitic_readiness_proxy": 0.727828571, "temperature_context_readiness_proxy": 0.734771429, "retest_false_fail_readiness_proxy": 0.6724, 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"downstream_contact_stability_priority_band": "review-like", "downstream_parasitic_priority_band": "lower-priority", "downstream_thermal_priority_band": "lower-priority", "downstream_retest_coverage_priority_band": "review-like", "downstream_model_limit_priority_band": "review-like", "teaching_probe_test_handoff_gate": "blocked-pending-owned-evidence" } ], "sourceSummary": { "sources": 20, "claimNodes": 16, "linkStatus": "pass", "reachable": 20, "accessGated": 0, "hardFailures": 0, "networkErrors": 0, "sourceBodiesStored": false, "sourceNumericUse": "none" }, "currentPublicBaseline": { "version": "v109", "versionId": "appgprj_6a6f4d3affc0819189d99a8f29062540~appgver_005d791cd0f881919fe28dce4fc90e8f", "deploymentId": "appgdep_6a91677cd40081919caf523a472130f6", "sourceCommit": "c3888cc26eb434d9ca88e76889f781194044db4a", "changedByThisPacket": false, "publicVersionReserved": "none", "releaseDecision": "hold" }, "publicDelivery": { "mode": "metadata-manifest-plus-csv-rows", "rowsEmbedded": false, "rowArtifact": "probe-test-state-v1.csv", "rowArtifactSha256": "994872BB080408357C15A625D13EE05B6A209E4F2D48C6CC97F9E780ABDCB543", "canonicalRowBearingArtifact": "probe-test-state-web-v1.json", "canonicalRowBearingArtifactSha256": "9B2F2955CAE8DB6B613AE807FACAB4F4C993CE4501927F0AFF6FD443863B33E5", "independentValidationArtifact": "validation-report-v1.json", "independentValidationArtifactSha256": "ED966F30B12EDBE1EE44B7AA897B6BDD260C3603C5CD77B3005FA6B5DDB0F4D0", "sourceSpineArtifact": "probe-test-source-spine-v1.json", "sourceSpineArtifactSha256": "44E88C8C7ADCBB77809ED72981CC09FEA61591C5578EEE9900F163974DD348F2", "publicHoldArtifact": "public-hold-verification-v1.json", "publicHoldArtifactSha256": "895928990DC928B2DB72EED915E85E7ECCD57547B11B274F70057A102FB8EF8E" }, "contracts": { "state": { "file": "probe-test-state-contract-v1.json", "sha256": "1796CF4EF4C3B5E6C253104F3E80D952F0D9B86A921369BD933DA1DBE426683F" }, "metrics": { "file": "probe-test-metric-contract-v1.json", "sha256": "766E30757198538CEF99023E4E6CFC9AAD273981701F2C80FD07FAD41487E672" }, "verifier": { "file": "independent-verifier-contract-v1.json", "sha256": "263781A7039E03E4F8372B8E76EC2E03BD61EA78020E3DE8B2D2A09E9BED3DBC" }, "sourceCatalog": { "file": "source_catalog_v1.json", "sha256": "4788DCE00091BE50F7649934ECB145E46210AE1550AEAC07FABCF0827C85F984" }, "claimMap": { "file": "source_claim_map_v1.json", "sha256": "78E9B4D538C082BD50D4357C29022F6B7B222ADF58478D404DAE9C5A0B3CE2A4" } }, "probeTestRegimes": [ "probe-test-family-context-limited", "contact-mechanics-limited", "contact-resistance-limited", "parasitic-limited", "temperature-context-limited", "retest-false-fail-limited", "coverage-evidence-limited", "bounded-probe-test-review" ], "requiredPhenomena": [ "probe-test-family-contact-mechanics-contact-resistance-parasitic-temperature-retest-coverage-and-handoff-separation", "wafer-prober-probe-card-and-thermal-chuck-applicability-boundary", "contact-force-overdrive-alignment-needle-pad-interaction-and-repeatability-evidence-separation", "contact-resistance-stability-parasitic-rf-calibration-and-cleaning-evidence-separation", "temperature-chuck-elevated-temperature-calibration-and-drift-evidence-separation", "first-pass-retest-false-fail-fail-count-coverage-escape-and-adaptive-test-evidence-separation", "substrate-map-tracking-equipment-performance-data-collection-and-traceability-boundary", "probe-test-model-limit-owned-replacement-evidence-and-human-action-boundary" ], "upstreamBridges": [ { "sourceExperimentId": "SA-PKG-THIN-DICE-038", "allowedFields": [ "downstream_probe_contact_readiness_band", "downstream_contact_resistance_priority_band", "downstream_parasitic_priority_band", "downstream_false_fail_priority_band", "downstream_model_limit_priority_band", "downstream_probe_evidence_gate", "downstream_test_evidence_gate", "teaching_thinning_dicing_handoff_gate" ], "physicalUnitsAllowed": false, "automaticStateImportAllowed": false, "evidencePostureOnly": true }, { "sourceExperimentId": "SA-MET-INSPECTION-030", "allowedFields": [ "downstream_fdc_measurement_readiness_band", "downstream_measurement_traceability_band", "downstream_sampling_priority_band", "downstream_nuisance_priority_band", "downstream_uncertainty_priority_band", "downstream_fdc_evidence_gate", "downstream_yield_evidence_gate", "teaching_metrology_handoff_gate" ], "physicalUnitsAllowed": false, "automaticStateImportAllowed": false, "evidencePostureOnly": true }, { "sourceExperimentId": "SA-EQP-EDGE-BEVEL-032", "allowedFields": [ "downstream_cluster_tool_readiness_band", "downstream_routing_priority_band", "downstream_contamination_priority_band", "downstream_edge_defect_priority_band", "downstream_model_limit_priority_band", "downstream_cluster_tool_evidence_gate", "downstream_yield_evidence_gate", "teaching_edge_bevel_handoff_gate" ], "physicalUnitsAllowed": false, "automaticStateImportAllowed": false, "evidencePostureOnly": true }, { "sourceExperimentId": "SA-PROC-SUBSTRATE-WAFERING-036", "allowedFields": [ "downstream_bonding_surface_readiness_band", "downstream_geometry_warpage_priority_band", "downstream_surface_defect_priority_band", "downstream_particle_contamination_priority_band", "downstream_model_limit_priority_band", "downstream_bonding_evidence_gate", "downstream_packaging_evidence_gate", "teaching_substrate_wafering_handoff_gate" ], "physicalUnitsAllowed": false, "automaticStateImportAllowed": false, "evidencePostureOnly": true }, { "sourceExperimentId": "SA-EQP-CHAMBER-STATE-FDC-031", "allowedFields": [ "downstream_edge_bevel_equipment_readiness_band", "downstream_maintenance_priority_band", "downstream_drift_priority_band", "downstream_fault_signature_priority_band", "downstream_model_limit_priority_band", "downstream_edge_bevel_evidence_gate", "downstream_yield_evidence_gate", "teaching_chamber_state_handoff_gate" ], "physicalUnitsAllowed": false, "automaticStateImportAllowed": false, "evidencePostureOnly": true } ], "downstreamBridge": { "targetExperimentId": "SA-PKG-PANEL-040", "allowedOutputFields": [ "downstream_panel_test_readiness_band", "downstream_contact_stability_priority_band", "downstream_parasitic_priority_band", "downstream_thermal_priority_band", "downstream_retest_coverage_priority_band", "downstream_model_limit_priority_band", "downstream_panel_evidence_gate", "downstream_packaging_test_evidence_gate", "teaching_probe_test_handoff_gate" ], "physicalUnitsAllowed": false, "automaticActionAllowed": false, "automaticStateTransferAllowed": false, "status": "blocked-until-owned-panel-level-replacement-evidence" }, "replacementEvidenceRequirements": [ "Accountable wafer, lot, die, device, probe-card, prober, thermal-chuck, and test-program identity with approved ownership and revision history.", "Revisioned probe-card architecture, needle or MEMS structure, pad stack, prober configuration, chuck configuration, and test-program change record.", "Owned contact-force, overdrive, alignment, planarity, repeatability, touchdown, scrub, and pad-interaction measurements with uncertainty.", "Owned contact-resistance measurements, stability studies, repeat-contact history, and metrology-system analysis for the intended device and pad stack.", "Owned cleaning method, cleaning interval, contamination inspection, probe-tip condition, contact-cycle history, and before-after evidence.", "Owned parasitic, RF fixture, impedance, repeatability, de-embedding, and calibration evidence across the intended frequency context.", "Owned chuck-temperature setpoint, stability, gradient, soak, contact-temperature, drift, and elevated-temperature repeatability evidence.", "Owned traceable calibration chain, reference artifacts, calibration status, uncertainty budget, gauge study, and expiry control.", "Owned substrate map, wafer orientation, die coordinates, substrate tracking, row identity, and data-lineage reconciliation.", "Owned equipment-performance, alarm, maintenance, drift, fault-signature, and data-collection records aligned to the replay interval.", "Owned first-pass, retest, repeated-fail, intermittent-fail, fail-count, and test-time records with versioned test context.", "Owned false-fail labels, adjudication criteria, review outcomes, operator interventions, and accountable disposition history.", "Owned coverage, fault-model, defect-screen, escape-estimation, guard-band, and independent validation evidence for the intended product.", "Owned adaptive-test proposal, control bounds, rollback criteria, shadow-run evidence, escape audit, and approved change governance.", "Approved sampling plan, acceptance criteria, qualification protocol, reliability review, product limits, and production-release authority.", "Approved wafer-probe engineering, probe-card engineering, test-product engineering, test-metrology engineering, quality, and accountable human sign-off." ], "requiredSections": [ "Explore", "Run Card", "Export", "Methods", "Limits", "Evidence" ], "limitation": "Original dimensionless wafer probing and testing evidence teaching replay only. No physical probe or test setting, contact value, parasitic value, temperature result, calibration value, test limit, pass/fail, retest action, test reduction, equipment action, qualification, disposition, production fitness, or release decision is computed or implied." }