# SemiAgora PTR Model Card

Version: 2026-08-12-v56

Scope: packaging, test, and reliability teaching replays for SA-PTR-001.

## Public Contract

- Execution mode: precomputed-only.
- Intended use: vocabulary, trend reading, evidence planning, and paper-review prompts.
- Non-use: product package design, signal-integrity or power-integrity signoff, thermal-design release, ATE program generation, wafer-sort limit release, JEDEC qualification, customer quality claims, or production release decisions.

## Datasets

- `ptr-package-parasitics-rlc-web-v1.json`: package RLC and PDN trend literacy across teaching integration cases.
- `ptr-thermal-resistance-stack-web-v1.json`: thermal-resistance stack and hotspot proxy trend literacy.
- `ptr-wafer-sort-binning-yield-web-v1.json`: guardband, yield, escape, retest, and binning tradeoff literacy.
- `ptr-accelerated-stress-bathtub-web-v1.json`: bathtub curve and reliability stress vocabulary.

## Source Spine

- NIST National Advanced Packaging Manufacturing Program.
- NIST advanced semiconductor packaging material-needs publication.
- NIST semiconductor reliability metrology publication.
- SEMI Heterogeneous Integration Roadmap.

## Upgrade Path

Replace teaching proxies with rights-clean measured summaries only when each artifact carries sample count, units, uncertainty, source rights, extraction rules, and an explicit non-claim boundary. Do not publish proprietary package designs, ATE programs, production bin limits, restricted standards text, or qualification reports.