{
  "schema": "semiagora.rf-sparameter-source-spine.v1",
  "version": "2026-08-24-v100",
  "experimentId": "SA-KNOW-RF-SPARAM-001",
  "generatedDate": "2026-08-24",
  "rightsPolicy": "Use official links, public metadata, and original synthesis only. Do not mirror standards, papers, course files, code examples, Touchstone datasets, plots, tables, or external device values.",
  "sources": [
    {
      "id": "src-nist-optimal-multiline-trl",
      "label": "NIST: An Optimal Multiline TRL Calibration Algorithm",
      "organization": "NIST",
      "url": "https://www.nist.gov/publications/optimal-multiline-trl-calibration-algorithm",
      "sourceClass": "government-primary-publication",
      "rights": "Official publication metadata and link only; no paper text, figure, table, or measurement is mirrored.",
      "note": "Primary calibration and uncertainty anchor for multiline TRL and error-box reasoning."
    },
    {
      "id": "src-nist-characteristic-impedance",
      "label": "NIST: Characteristic Impedance Determination Using Propagation Constant Measurement",
      "organization": "NIST",
      "url": "https://www.nist.gov/publications/characteristic-impedance-determination-using-propagation-constant-measurement",
      "sourceClass": "government-primary-publication",
      "rights": "Official publication metadata and link only; no article content or external numeric result is copied.",
      "note": "Reference-impedance and transmission-line interpretation anchor."
    },
    {
      "id": "src-nist-reciprocity-waveguide",
      "label": "NIST: Reciprocity Relations in Waveguide Junctions",
      "organization": "NIST",
      "url": "https://www.nist.gov/publications/reciprocity-relations-waveguide-junctions",
      "sourceClass": "government-primary-publication",
      "rights": "Official metadata and link only; the paper and its experimental evidence are not mirrored.",
      "note": "Boundary anchor showing that reciprocity interpretation depends on waveguide and reference-impedance definitions."
    },
    {
      "id": "src-nist-sparameter-noise-influence",
      "label": "NIST: Noise Influence on Scattering-Parameter Measurements",
      "organization": "NIST",
      "url": "https://www.nist.gov/publications/noise-influence-scattering-parameter-measurements",
      "sourceClass": "government-primary-publication",
      "rights": "Official publication page and original synthesis only; no measurement data or article content is copied.",
      "note": "Uncertainty anchor for noise-influenced complex S-parameter measurements, especially small-magnitude terms."
    },
    {
      "id": "src-nist-transistor-noise-parameters",
      "label": "NIST: On-Wafer Measurement of Transistor Noise Parameters",
      "organization": "NIST",
      "url": "https://www.nist.gov/publications/wafer-measurement-transistor-noise-parameters-nist",
      "sourceClass": "government-primary-publication",
      "rights": "Official metadata and link only; no measured transistor values, tables, figures, or paper text are reused.",
      "note": "Noise-parameter measurement and uncertainty boundary anchor."
    },
    {
      "id": "src-ieee-370-2020",
      "label": "IEEE 370-2020 fixture and interconnect characterization standard",
      "organization": "IEEE Standards Association",
      "url": "https://standards.ieee.org/ieee/370/6165/",
      "sourceClass": "active-standard-metadata",
      "rights": "Controlled standard; public title, scope metadata, and official link only. No standard text is reproduced.",
      "note": "Official scope anchor for high-frequency interconnect quality and fixture-removal practices."
    },
    {
      "id": "src-scikit-rf-deembedding",
      "label": "scikit-rf official de-embedding tutorial",
      "organization": "scikit-rf",
      "url": "https://scikit-rf.readthedocs.io/en/latest/tutorials/Deembedding.html",
      "sourceClass": "open-source-documentation",
      "rights": "Official documentation link; project documentation and code licenses apply. No example dataset or code is mirrored.",
      "note": "Calibration-versus-de-embedding and reference-plane learning anchor."
    },
    {
      "id": "src-scikit-rf-ieee-p370",
      "label": "scikit-rf IEEE P370 de-embedding example",
      "organization": "scikit-rf",
      "url": "https://scikit-rf.readthedocs.io/en/latest/examples/networktheory/IEEEP370%20Deembedding.html",
      "sourceClass": "open-source-documentation",
      "rights": "Official documentation link; no notebook text, plot, code, or dataset is copied.",
      "note": "2x-Thru terminology, fixture quality, passivity, reciprocity, and causality review anchor. This packet does not execute that implementation."
    },
    {
      "id": "src-mit-ocw-sparameters",
      "label": "MIT OCW 6.976: S-Parameters and Impedance Transformers",
      "organization": "MIT OpenCourseWare",
      "url": "https://ocw.mit.edu/courses/6-976-high-speed-communication-circuits-and-systems-spring-2003/resources/lec3/",
      "sourceClass": "open-course-resource",
      "rights": "Official course-resource link and original synthesis only; item-level OCW terms apply.",
      "note": "S-parameter, reference impedance, reflection, and transmission learning anchor."
    },
    {
      "id": "src-mit-ocw-ft",
      "label": "MIT OCW 6.720J: MOSFET small-signal behavior and current-gain cutoff",
      "organization": "MIT OpenCourseWare",
      "url": "https://ocw.mit.edu/courses/6-720j-integrated-microelectronic-devices-spring-2007/resources/lecture27/",
      "sourceClass": "open-course-resource",
      "rights": "Official course-resource link and original synthesis only; the lecture file is not mirrored.",
      "note": "Small-signal and short-circuit current-gain cutoff-frequency anchor."
    },
    {
      "id": "src-berkeley-hu-high-frequency",
      "label": "UC Berkeley: High-frequency performance definitions",
      "organization": "UC Berkeley EECS",
      "url": "https://www.chu.berkeley.edu/wp-content/uploads/2020/01/Chenming-Hu-ch6-slides.pdf",
      "sourceClass": "university-course-resource",
      "rights": "Official faculty-hosted course-resource link; no slide text, figure, table, device value, or comparison is copied.",
      "note": "Definition and input-resistance/capacitance boundary anchor for fT and fmax; the packet uses original assumed inputs only."
    },
    {
      "id": "src-bsim-models",
      "label": "UC Berkeley BSIM model families",
      "organization": "UC Berkeley BSIM Group",
      "url": "https://www.bsim.berkeley.edu/models/",
      "sourceClass": "compact-model-reference",
      "rights": "Official model distribution and documentation links; model-specific licenses apply. No model package is mirrored.",
      "note": "Compact-model provenance boundary for real RF extraction and replacement evidence."
    }
  ],
  "claimMap": [
    {
      "nodeId": "kn-dv-091",
      "topic": "Small-signal parameters",
      "evidence": [
        "src-mit-ocw-sparameters",
        "src-mit-ocw-ft",
        "src-bsim-models"
      ],
      "packetOutputs": [
        "complex intrinsic, measured, and corrected S matrices",
        "assumed small-signal parameter card"
      ]
    },
    {
      "nodeId": "kn-dv-092",
      "topic": "Cutoff and maximum oscillation frequency",
      "evidence": [
        "src-mit-ocw-ft",
        "src-berkeley-hu-high-frequency"
      ],
      "packetOutputs": [
        "first-order fT and fmax screens",
        "current-gain distance to unity"
      ]
    },
    {
      "nodeId": "kn-dv-093",
      "topic": "RF noise",
      "evidence": [
        "src-nist-transistor-noise-parameters",
        "src-nist-sparameter-noise-influence"
      ],
      "packetOutputs": [
        "four-noise-parameter equation replay",
        "measurement and uncertainty boundary"
      ]
    },
    {
      "nodeId": "kn-dv-094",
      "topic": "Transmission-line effects",
      "evidence": [
        "src-mit-ocw-sparameters",
        "src-nist-characteristic-impedance",
        "src-nist-reciprocity-waveguide"
      ],
      "packetOutputs": [
        "positive-delay passive fixture cascade",
        "reference-impedance and reciprocity caution"
      ]
    },
    {
      "nodeId": "kn-dv-095",
      "topic": "RF device de-embedding",
      "evidence": [
        "src-nist-optimal-multiline-trl",
        "src-ieee-370-2020",
        "src-scikit-rf-deembedding",
        "src-scikit-rf-ieee-p370"
      ],
      "packetOutputs": [
        "four correction method classes",
        "fixture residual and replacement-evidence gates"
      ]
    }
  ],
  "reviewBoundary": [
    "Cluster-level evidence review does not mean every RF method, standard clause, device technology, or measurement uncertainty mechanism has been reviewed.",
    "Calibration, reference-plane movement, and de-embedding are kept distinct; none is represented as an instrument operation.",
    "The IEEE 370 and copyrighted publication anchors are link-and-metadata only, and the symmetric split-fixture row is explicitly a teaching proxy rather than a standards implementation."
  ]
}