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false } }, "evidenceBoundary": { "evidenceClass": "illustrative-original-surrogate", "calibration": "none", "measuredReplacementSlots": [ "A governed sampling plan with actual condition, lot, wafer, die, site, replicate, and exclusion genealogy.", "Qualified fixed-corner or condition definitions with explicit scope; no statistical-sigma mapping unless independently defined.", "Measured or transistor-level read, write, and inverter-skew metrics with extraction definitions, bias, temperature, and units.", "A validated covariance or hierarchical variance model with sufficient independent groups and uncertainty intervals.", "Measurement-system repeatability, reproducibility, resolution, bias, and uncertainty evidence." ], "prohibitedInterpretations": [ "PDK or foundry corner equivalence", "fixed corner equals a statistical sigma", "physical read or write margin prediction", "silicon Vmin", "cell failure probability", "array yield", "process capability", "recipe recommendation", "qualification", "foundry signoff", "production readiness" ] }, "sourceSpine": [ { "id": "nist-nested-variation", "title": "How can I account for nested variation?", "organization": "NIST/SEMATECH", "url": "https://www.itl.nist.gov/div898/handbook/pri/section5/pri55.htm", "supports": [ "Batch, wafer, and site observations form a nested sampling structure.", "Random effects can separate variance contributions only under declared assumptions." ], "use": "hierarchy and denominator vocabulary", "rights": "link-only; NIST notices apply" }, { "id": "nist-variance-components", "title": "What are variance components?", "organization": "NIST/SEMATECH", "url": "https://www.itl.nist.gov/div898/handbook/prc/section4/prc44.htm", "supports": [ "Variance components attribute portions of variability to declared factors.", "Finite component estimates can carry substantial uncertainty." ], "use": "variance-component and uncertainty boundary", "rights": "link-only; NIST notices apply" }, { "id": "nist-standard-deviation-confidence", "title": "Confidence interval approach for standard deviation", "organization": "NIST/SEMATECH", "url": "https://www.itl.nist.gov/div898/handbook/prc/section2/prc231.htm", "supports": [ "Standard-deviation uncertainty depends on sample size and distribution assumptions.", "Degrees of freedom must accompany an uncertainty statement." ], "use": "sigma-estimate uncertainty context", "rights": "link-only; NIST notices apply" }, { "id": "nist-tn1297-reporting", "title": "NIST TN 1297: Reporting Uncertainty", "organization": "NIST", "url": "https://www.nist.gov/pml/nist-technical-note-1297/nist-tn-1297-7-reporting-uncertainty", "supports": [ "Uncertainty components and degrees of freedom should be identified.", "The method and interpretation supporting an interval must be reported." ], "use": "reporting discipline only", "rights": "link-only; NIST notices apply" }, { "id": "src-pdy-mos-matching-1989", "title": "Matching Properties of MOS Transistors", "organization": "IEEE", "url": "https://doi.org/10.1109/JSSC.1989.572629", "supports": [ "Category-level provenance for local device mismatch and statistical parameter-variation boundaries." ], "use": "category-level semiconductor variability context only", "rights": "link-only. Link-only metadata and original synthesis; Link-only metadata and category-level provenance. No source body, abstract wording, numeric value, equation, coefficient, geometry, material property, process condition, measurement, model parameter, defect or yield value, method setting, specification limit, figure, table, code, image, model output, named-tool output, copied artifact, automatic action, acceptance, qualification, signoff, publication, disposition, or production decision enters generated artifacts.." }, { "id": "src-pdy-spatial-variation-decomposition-1997", "title": "Analysis and Decomposition of Spatial Variation in Integrated Circuit Processes and Devices", "organization": "IEEE", "url": "https://doi.org/10.1109/66.554480", "supports": [ "Category-level provenance for spatial variation decomposition across process and device observations." ], "use": "category-level semiconductor variability context only", "rights": "link-only. Link-only metadata and original synthesis; Link-only metadata and category-level provenance. No source body, abstract wording, numeric value, equation, coefficient, geometry, material property, process condition, measurement, model parameter, defect or yield value, method setting, specification limit, figure, table, code, image, model output, named-tool output, copied artifact, automatic action, acceptance, qualification, signoff, publication, disposition, or production decision enters generated artifacts.." }, { "id": "src-pdy-statistical-sram-stability-2006", "title": "Statistical Analysis of SRAM Cell Stability", "organization": "ACM", "url": "https://doi.org/10.1145/1146909.1146928", "supports": [ "Category-level provenance for SRAM stability, process variation, and statistical yield boundaries." ], "use": "category-level semiconductor variability context only", "rights": "link-only. Link-only metadata and original synthesis; Link-only metadata and category-level provenance. No source body, abstract wording, numeric value, equation, coefficient, geometry, material property, process condition, measurement, model parameter, defect or yield value, method setting, specification limit, figure, table, code, image, model output, named-tool output, copied artifact, automatic action, acceptance, qualification, signoff, publication, disposition, or production decision enters generated artifacts.." }, { "id": "semiagora-v127-upstream", "title": "LER/LWR to SRAM variability chain", "organization": "SemiAgora", "url": "/simulations/ler-lwr-variability-chain", "supports": [ "Upstream geometry-to-bounded-proxy continuity.", "Measured replacement and yield-stop boundaries." ], "use": "internal public continuity", "rights": "public SemiAgora route" } ], "interactionContract": { "runtime": "React state in the current browser tab", "presets": [ "default", "lotDominant", "waferDominant", "spatialDominant", "localDominant", "noiseDominant", "controlledMissingness", "fixedConditionsOnly" ], "controls": [ "seed", "lot sigma", "wafer sigma", "spatial sigma", "local mismatch sigma", "measurement-noise sigma", "missing cell-condition rate", "missing replicate rate", "metric", "condition", "analysis view", "sample or population divisor" ], "views": [ "Distribution", "Components", "Coverage", "Balance", "Corners", "Evidence" ], "charts": [ "selected-distribution histogram", "component standard-deviation bars", "wafer spatial map", "condition coverage matrix", "PD/PG/PU fixed-direction bars" ], "exports": [ "json", "csv" ], "deterministicExport": true, "resetRequiresExplicitCommand": true, "keyboardAccessibleLabels": true, "reducedMotionSupported": true, "noLocalStorage": true, "noSessionStorage": true, "noIndexedDb": true, "noUrlState": true }, "privacy": { "browserTabStateOnly": true, "bundledSyntheticInputsOnly": true, "networkWrites": false, "accounts": false, "uploads": false, "productionData": false, "productionIdentifiers": false, "internalCornerDecks": false, "pdkData": false, "privateMeasurements": false, "processRecipes": false, "equipmentControls": false, "serverPersistence": false, "remoteFreeFormStorage": false, "analytics": false, "behavioralSignals": false, "aiModelCalls": false, "cookies": false, "localStorage": false, "sessionStorage": false, "indexedDb": false, "queryState": false, "fragmentState": false, "liveSolver": false, "liveMonteCarloService": false, "backgroundJobs": false, "databaseAccess": false, "cloudStorage": false }, "limitations": [ "Every row, condition, component, strength, margin value, missingness flag, and distribution is deterministic synthetic teaching data.", "The balanced hierarchy and orthogonalized fields are designed for interpretability; they are not a foundry sampling plan or covariance model.", "The four fixed conditions are deliberate directions, not sampled tails, PDK corners, or sigma equivalents.", "PD, PG, and PU strengths and the read, write, and inverter-skew values are linear original proxies with arbitrary visible coefficients and no calibration.", "The first-order sigma uncertainty reference assumes iid normal observations; nested and repeated rows are not independently sampled.", "Finite subsets and missingness can create component covariance, so diagonal component variances alone need not equal total variance.", "The lab cannot establish physical causality, statistical representativeness, measurement adequacy, process capability, Vmin, failure probability, array yield, recipe transfer, qualification, signoff, or production readiness.", "Researcher-facing businesses remain deferred to a separately verified V200 contract." ] }