METRIC CONTRACTS / V132
Check what a value means before comparing the number.
English master terms and Korean aliases lead to explicit quantity, unit, denominator, sign, grain, condition, and extraction contracts. Similar labels never become equivalent by guesswork.
INSPECTION WORKSPACE
Search bilingual terminology, inspect complete and unresolved contracts, then test one explicit relationship without storing or sending your selection.
Loading all 471 contracts locally...
임계 전압 / 문턱 전압
VTH · VthA declared extraction result used to mark MOSFET turn-on under specified terminal bias, geometry, temperature, and method.
It is not one universal physical switch point. Constant-current and transconductance-extrapolation values are different metric contracts.오프 상태 전류 / 오프 전류
Ioff · I_OFFDrain current measured or computed at a declared off-state bias and temperature.
Leakage current is broader. Total-device current and geometry-normalized current are not interchangeable.트랜스컨덕턴스 효율 / 상호 컨덕턴스 효율
gm/Id · g_m/I_DSmall-signal transconductance divided by drain current at one declared operating point.
The S/A and inverse-volt forms are dimensionally equivalent only when bias, extraction, and current sign conventions match.임계 치수 / 주요 선폭
CDA specified geometric dimension extracted at a declared feature, measurement plane, method, and sampling grain.
CD does not identify top, middle, bottom, drawn, or electrical width by itself.선 가장자리 거칠기 / 라인 에지 거칠기
LERStatistical variation of one edge position after a declared detrend, bandwidth, sampling, and estimator.
RMS and three-sigma forms require an explicit conversion under the same samples and estimator. LER is not LWR.선폭 거칠기 / 라인 폭 거칠기
LWRStatistical variation of right-edge minus left-edge linewidth after a declared detrend, bandwidth, sampling, and estimator.
Its relationship to LER depends on both edge variances and covariance; two times LER is not universal.국부 임계 치수 / 로컬 CD
LCD · local CDA local linewidth statistic computed over a declared spatial aperture and sampling rule.
Aperture, edge definition, sample count, and histogram denominator are part of the contract.전파 지연
tpd · t_pdElapsed time between declared input and output threshold crossings with direction and interpolation fixed.
Linear interpolation and first-saved-sample extraction are related but not numerically equivalent.상승 시간
tr · t_rElapsed time for one waveform to cross a lower and upper threshold in the rising direction.
Rise time is not input-to-output propagation delay even when both use picoseconds.정적 잡음 여유 / 정적 노이즈 마진
SNMA declared DC stability margin of a bistable cell, commonly extracted from a butterfly construction.
Hold, read, and write contexts are different contracts and must retain cell, bias, and extraction conditions.읽기 마진 산포 / 리드 마진 산포
sigma_readDispersion of a declared read-margin observable over a named hierarchy and condition set.
Row count is not automatically the independent sample count when lot, wafer, site, cell, condition, or replicate levels are shared.분산 폐합 / 분산 성분 폐합
VarA ledger relating total variance to component variances and covariance terms under one declared sample set.
Finite subsets and missingness can leave a covariance remainder; it must not be silently forced to zero.조건 커버리지 / 조건 포함률
coverageObserved support relative to an explicitly declared condition set and counted unit.
Selected, common, union, and missing-condition denominators are distinct; missing is not numeric zero.정규화 비율 / 정규화 분율
rA dimensionless ratio with an explicitly named numerator, denominator, domain, and grain.
A 0-to-1 teaching proxy is not automatically a probability, yield, confidence, or quality score.백분율 / 퍼센트
%One hundred times a declared dimensionless ratio.
The percent symbol does not supply a missing numerator, denominator, population, or uncertainty model.수율
YA good-unit count divided by a declared opportunity or started-unit denominator at a named grain.
Die yield, wafer yield, lot yield, first-pass yield, and modeled yield are not interchangeable.막 두께 / 박막 두께
tDistance between declared film interfaces measured or computed by a specified method and grain.
Mean, center, edge, local, and fitted thickness need separate context even when units convert exactly.식각 선택비 / 에치 선택비
S_A/BEtch rate of named material A divided by etch rate of named material B under the same declared condition.
Reversing numerator and denominator requires an explicit reciprocal conversion and a nonzero value.드레인 유도 장벽 저하
DIBLChange in an explicitly extracted threshold metric per declared drain-bias change.
Signed derivative and positive degradation magnitude use different sign conventions and units.정규화 교육용 대리지표
proxyA packet-specific dimensionless value generated from declared original teaching equations.
Identical labels or 0-to-1 ranges across packets do not establish equivalence, desirability, causality, or calibration.기존 표시 지표
legacyA public metric label and value string whose complete comparison dimensions were not structured in the V131 catalog.
It receives a stable identifier but remains UNKNOWN and cannot enter numeric comparison until its missing fields are reviewed.PUBLIC EVIDENCE BOUNDARY
A structurally comparable pair can still come from a poor measurement, invalid model, or unsupported claim.