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SASemiAgoraSemiconductor knowledge & engineeringOpen run card

PROCESS REPLAY LAB / SA-PROC-APC-FDC-002

Process-control evidence needs a decision gate.
Process / Metrology / Yield

An APC/FDC claim is useful only when signal quality, FDC state, VM uncertainty, sampling coverage, feedforward handoff, false-alarm risk, wafer-at-risk, and role review stay in one bounded packet.

Open simulationStudy lesson ->
packetSA-PROC-APC-FDC-002runSimulation ObjectlearnEvidence SequencemethodMethodslimitsBoundaries

EVIDENCE SEQUENCE

What the learner should inspect first.

This surface connects the daily-scan source signal to an original SemiAgora simulation object without copying source text, code, figures, PDK files, or process recipes.

01

Start with module context, signal pack, FDC state, control handoff, sampling plan, and role view before reading a decision-readiness score.

Open the run card to inspect the saved rows, methods, limits, and export files behind this step.

Inspect run card ->
02

Compare data quality, drift pressure, fault likelihood, classification confidence, metrology coverage, VM uncertainty, false-alarm risk, wafer-at-risk, and feedforward value together.

Open the run card to inspect the saved rows, methods, limits, and export files behind this step.

Inspect run card ->
03

Use the decision gate to decide whether the next safe check is data-quality review, FDC review, VM uncertainty review, sampling review, feedforward handoff review, owner review, or bounded teaching use.

Open the run card to inspect the saved rows, methods, limits, and export files behind this step.

Inspect run card ->

METHODS

Precomputed model contract.

The goal is useful study scaffolding and paper-planning discipline, not calibrated production evidence.

method

Original synthetic APC/FDC/feedforward table based on public SEMI, NIST, IRDS, and feedforward-control vocabulary.

The simulation object keeps the same statement beside downloadable JSON and CSV evidence.

method

No standards body, article body, tool log, equipment trace, process recipe, APC implementation, FDC rule, model code, factory procedure, or metrology table is copied.

The simulation object keeps the same statement beside downloadable JSON and CSV evidence.

method

The browser filters saved CSV rows and exposes the model card with no-live-control, no-production, and no-quality-disposition boundaries.

The simulation object keeps the same statement beside downloadable JSON and CSV evidence.

LIMITS

Useful, but deliberately bounded.

No account, upload, payment, comment, newsletter, live solver, facility workflow, or product-release surface is enabled.

non-claim

No process recipe, equipment-control instruction, APC programming, FDC deployment rule, interlock procedure, uploaded wafer-data parsing, or live server model.

Keep this boundary attached when reusing the card for lesson writing, figure planning, or research notes.

non-claim

No tool setting, production setting, quality disposition, foundry claim, product claim, qualification claim, public intake, account, payment, comment, or job workflow.

Keep this boundary attached when reusing the card for lesson writing, figure planning, or research notes.

non-claim

Real work needs owned tool traces, physical metrology, uncertainty budgets, sampling policy, change-control evidence, and process/metrology/yield owner review.

Keep this boundary attached when reusing the card for lesson writing, figure planning, or research notes.

SOURCE ANCHOR

Link-only public source spine.

SemiAgora uses the source as a signal and citation anchor, then writes original summaries and original toy data with explicit limitations.

SEMI Smart Manufacturing Standards

https://www.semi.org/en/industry-groups/smart-manufacturing/standards

Open source ->