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SIMULATION / SA-INT-PROCESS-DEVICE-YIELD-042

Process-device-yield integration evidence map
Trace variation through device, circuit, reliability, genealogy, and yield evidence.

Follow bounded process variation families through device characterization, circuit margin, reliability and yield observations, three exact ledgers, four accountable role views, upstream packet postures, and a human-reviewed public-atlas gate without claiming physical causality, signoff, qualification, or production fitness.

Public releaseV110
Verification42/42 dual-domain pass
Source commit1c16af201ccfbae48baac8271ebba9feb17a12d2
Trace release lineage ->
sectionExploresectionRun CardsectionExportsectionMethodssectionLimitssectionEvidence

EXPLORE

Start with the observable.

Use this page when the simulation is the primary artifact. The linked lesson explains the concept; the linked lab keeps the visual replay surface available.

guided exploration
  • Hold the seven categorical evidence axes fixed and move through eight ordered integration states to compare review readiness, atlas handoff readiness, and model-limit burden.
  • Switch among process integration, device modeling, circuit and reliability, and yield-learning role views to see which owned evidence each role must review.
  • Compare film, profile, interface, contact, and equipment-lineage variation families without collapsing correlation into a causal process-to-yield claim.
  • Inspect process, device, circuit, reliability, and genealogy ledgers separately; all exact residuals must remain zero while every physical or operational field remains disabled.
  • Trace upstream sustainability, metrology, chamber-state, and probe-test packet postures into the bounded v120 atlas bridge, where human publication review remains mandatory for every row.

BROWSER PROCESS-DEVICE-YIELD EVIDENCE LAB

Trace the handoff. Keep every evidence owner and limit visible.

Every score is an original dimensionless teaching proxy and every ledger is deterministic bookkeeping. This replay contains no measured film, device, circuit, reliability, test, defect, or yield value and cannot authorize an action.

Integration boundary
LoadingLoadingLoadingLoading112 prohibited fields remain zero
ordered evidence trace

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Review readinessAtlas handoffModel limit burden
bounded cross-domain chain

Process measurement to device, circuit, reliability, and yield evidence

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Process measurement-
Device evidence-
Circuit margin-
Reliability and yield-
public atlas readinessLoading

Process: LoadingDevice: LoadingCircuit: LoadingReliability/yield: Loading

Process integration view

Keep module variation and downstream evidence in one traceable chain.

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Film, profile, interface, contact, and equipment-lineage labels are investigation families. They are not physical settings, causal findings, or process-change instructions.

Replacement evidence: Owned module history, film and profile metrology, interface and contact observations, chamber genealogy, uncertainty, model applicability, and accountable integration review.

Process and variation boundary- tokensresidual -
  • Process context-
  • Variation source-
  • Unresolved-
Device observation evidence- tokensresidual -
  • Characterization-
  • Device model-
  • Unresolved-
Circuit, reliability, and yield handoff- tokensresidual -
  • Circuit margin-
  • Reliability-
  • Yield lineage-
  • Unresolved-
Four upstream packet boundaries

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Only categorical replacement-evidence posture is referenced. No upstream row, physical unit, setting, result, model parameter, specification, or disposition is transferred.

SA-EQP-SUSTAINABILITY-041
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SA-MET-INSPECTION-030
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SA-EQP-CHAMBER-STATE-FDC-031
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SA-TEST-PROBE-039
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SemiAgora public atlas v120 boundary

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The public bridge is a human-reviewed publication slot. It cannot transfer state, tune a model, change a margin or test limit, qualify a process or product, publish automatically, or trigger a production action.

Readiness band
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Integration evidence
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Publication evidence
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Automatic actions
Disabled
StateRegimeDeviceCircuitReliability/yieldReviewAtlasHandoff

RUN CARD

Conditions before conclusions.

The browser filters and renders the validated CSV. It does not infer causality; solve a physical model; import measurements; predict device, circuit, reliability, defect, or yield performance; operate equipment; calibrate, qualify, sign off, dispose, or publish automatically.

precomputed-browser-csv-process-device-yield-replay

Primary knobs

  • process-module, process-device-interface, or device-circuit-yield review boundary
  • film, profile, interface, contact, or equipment-lineage variation family
  • device-characterization, circuit-margin, or reliability-yield observation context
  • limited or supported device, circuit-margin, and reliability-yield evidence postures
  • teaching assumption or accountable replacement slot
outputs

Saved outputs

  • twenty normalized readiness or burden proxies and eight bounded review regimes
  • four role-specific review gates, five priority bands, and six evidence or handoff gates
  • three exact integer teaching ledgers covering process-device, circuit-reliability, and genealogy-yield evidence
  • four upstream packet postures and a v120 human-publication-review bridge with all automatic actions disabled

EXPORT

Download the public artifacts.

These exports are the supported public files for review. PDK files and restricted third-party material are not redistributed.

download

Process-device-yield CSV

/data/process-device-yield-state-v1.csv

Open file ->
download

Compact public manifest (JSON)

/data/process-device-yield-state-public-manifest-v1.json

Open file ->
download

Model card

/data/process-device-yield-model-card-v1.md

Open file ->
download

Metric contract

/data/process-device-yield-metric-contract-v1.json

Open file ->
download

Source spine

/data/process-device-yield-source-spine-v1.json

Open file ->

METHODS

How the number was made.

Methods are written for citation discipline: the extraction rule matters as much as the plotted value.

method

Complete deterministic 3 x 5 x 3 x 2 x 2 x 2 x 8 x 2 Cartesian sweep. Evidence posture changes ownership only, producing 2,880 paired physical states.

Keep this method attached when reusing the figure or metric.

method

Original dimensionless algebra keeps process variation, device evidence, circuit margin, reliability and yield evidence, measurement-model traceability, genealogy, model limits, and public-atlas readiness distinct.

Keep this method attached when reusing the figure or metric.

method

Sixteen exact integer teaching equations close across three ledgers for every row; an independent no-import verifier replays every equation, regime, role gate, bridge, evidence pair, prohibited field, and CSV cell.

Keep this method attached when reusing the figure or metric.

method

Twenty link-only official and DOI metadata anchors plus sixteen bounded claim nodes define terminology, rights, traceability, and replacement-evidence questions without supplying generated numbers.

Keep this method attached when reusing the figure or metric.

LIMITS

What this page does not claim.

The MVP is useful because the limits are visible. These statements prevent a teaching simulation from being cited as silicon evidence.

non-claim

Every state, priority band, gate, and readiness value is an original categorical or dimensionless teaching construct, not a physical process, device, circuit, reliability, test, defect, or yield prediction.

Carry this boundary into any derivative note, paper draft, or slide.

non-claim

The three exact integer ledgers establish deterministic bookkeeping consistency only; they do not establish causality, statistical validity, calibration, model transfer, traceability, qualification, or production fitness.

Carry this boundary into any derivative note, paper draft, or slide.

non-claim

No source body, source number, equation, coefficient, geometry, material property, process condition, measurement row, model parameter, circuit value, lifetime, defect density, yield result, specification, or named-tool output enters the generated data.

Carry this boundary into any derivative note, paper draft, or slide.

non-claim

No live server executes and no equipment-control instruction is provided. The replay cannot operate equipment, calibrate a model, set a process window, sign off a circuit, qualify reliability, bin product, dispose a wafer, publish automatically, or replace accountable human review.

Carry this boundary into any derivative note, paper draft, or slide.

EVIDENCE

Trace the claim back to artifacts.

The evidence route remains the catalog-level browser; this page is the simulation-level reading card.

evidence note

5760 rows across 2880 physical configurations and 2880 evidence pairs, with 192 fields.

SA-INT-PROCESS-DEVICE-YIELD-042

evidence note

Independent no-import verification passed 16/16 with 2955296 comparisons and full CSV parity.

SA-INT-PROCESS-DEVICE-YIELD-042

evidence note

All sixteen ledger equations close exactly across three ledgers; all 112 physical, recipe, command, model, test, qualification, signoff, disposition, and publication fields remain zero.

SA-INT-PROCESS-DEVICE-YIELD-042

evidence note

All eight process-device-yield review regimes are represented; the public-atlas evidence gate requires human publication review for all 5760 rows.

SA-INT-PROCESS-DEVICE-YIELD-042

evidence note

16 source anchors were reachable and 4 publisher endpoints were access-gated, with no hard or network failure and no source body or numeric transfer.

SA-INT-PROCESS-DEVICE-YIELD-042

Source spine

These links anchor the public teaching model. They do not convert the replay into a qualified process recipe or signoff result.

SEMI Standards: TraceabilityCategory-level provenance for device, manufacturing, test, assembly, and supply-chain traceability boundaries. Rights: link-only.SEMI Standards: Information and ControlCategory-level provenance for substrate tracking, equipment quality, advanced process control, data collection, and mapping vocabulary families. Rights: link-only.SEMI T23 - Specification for Single Device Traceability for the Supply ChainCategory-level provenance for single-device identity and supply-chain traceability boundaries. Rights: link-only.NIST CHIPS Metrology ProgramCategory-level provenance for semiconductor metrology, measurement assurance, reference methods, and standards needs. Rights: link-only.2024 International Roadmap for Devices and Systems: MetrologyCategory-level roadmap provenance for semiconductor metrology, characterization, uncertainty, and cross-domain measurement challenges. Rights: link-only.2023 International Roadmap for Devices and Systems: Factory IntegrationCategory-level roadmap provenance for factory integration, data, equipment, traceability, and manufacturing-system boundaries. Rights: link-only.Modeling the Dependency of Analog Circuit Performance Parameters on Manufacturing Process Variations With Applications in Sensitivity Analysis and Yield PredictionCategory-level provenance for process-parameter dependency, circuit sensitivity, and yield-prediction boundaries. Rights: link-only.Matching Properties of MOS TransistorsCategory-level provenance for local device mismatch and statistical parameter-variation boundaries. Rights: link-only.Random Dopant Induced Threshold Voltage Lowering and Fluctuations in Sub-0.1 Micrometer MOSFETs: A 3-D Atomistic Simulation StudyCategory-level provenance for atomistic random-dopant and threshold-voltage variability boundaries. Rights: link-only.Impact of Die-to-Die and Within-Die Parameter Fluctuations on the Maximum Clock Frequency Distribution for Gigascale IntegrationCategory-level provenance for die-to-die, within-die, and circuit-frequency variation boundaries. Rights: link-only.Estimation of Delay Variations Due to Random-Dopant Fluctuations in Nanoscale CMOS CircuitsCategory-level provenance for device random variation and downstream circuit-delay boundaries. Rights: link-only.Comparative Simulation Analysis of Process-Induced Variability in Nanoscale SOI and Bulk Trigate FinFETsCategory-level provenance for process-induced variability and device-architecture applicability boundaries. Rights: link-only.A Device-Level Characterization Approach to Quantify the Impacts of Different Random Variation Sources in FinFET TechnologyCategory-level provenance for device-level separation of random variation-source families. Rights: link-only.Analysis and Decomposition of Spatial Variation in Integrated Circuit Processes and DevicesCategory-level provenance for spatial variation decomposition across process and device observations. Rights: link-only.Impact of Systematic Spatial Intra-Chip Gate Length Variability on Performance of High-Speed Digital CircuitsCategory-level provenance for systematic spatial process variation and circuit-performance boundaries. Rights: link-only.Statistical Analysis of SRAM Cell StabilityCategory-level provenance for SRAM stability, process variation, and statistical yield boundaries. Rights: link-only.Yield Estimation Model for VLSI Artwork EvaluationCategory-level provenance for defect-sensitive artwork and yield-estimation model boundaries. Rights: link-only.Statistical Timing Analysis Under Spatial CorrelationsCategory-level provenance for spatial correlation and statistical timing-analysis boundaries. Rights: link-only.Test Structures for Delay VariabilityCategory-level provenance for test structures and measured delay-variability boundaries. Rights: link-only.Adaptive Body Bias for Reducing Impacts of Die-to-Die and Within-Die Parameter Variations on Microprocessor Frequency and LeakageCategory-level provenance for circuit adaptation, frequency, leakage, and variation-response boundaries. Rights: link-only.

Public execution boundary

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