5120synthetic dynamic Ron rowsUNKNOWNInspect metric contract
5buffer contextsUNKNOWNInspect metric contract
0live solver runsUNKNOWNInspect metric contract
SIMULATION / SA-PWR-GAN-DYNAMIC-RON-003
GaN dynamic-Ron and trap-memory replay
GaN Dynamic Ron
A browser CSV replay for reading GaN dynamic-Ron evidence as stress class, drain bias, buffer context, recovery window, temperature, current collapse, and measurement caution move together.
EXPLORE
Start with the observable.
Use this page when the simulation is the primary artifact. The linked lesson explains the concept; the linked lab keeps the visual replay surface available.
- Filter buffer context, off-state stress class, drain-bias class, recovery window, temperature class, and switching context before reading a dynamic-Ron ratio.
- Compare trap-memory proxy, current-collapse proxy, recovery score, thermal-risk proxy, switching-loss pressure, measurement caution, evidence maturity, and decision gate together.
- Use the decision gate to separate trap-memory review, recovery-window review, thermal-risk review, switching-context review, measurement-method review, and qualification-evidence-required rows.
- Keep the public boundary visible: this is not a JEDEC standard copy, product dataset, process recipe, dynamic-Ron measurement, device qualification, or reliability signoff.
BROWSER INTERACTIVE LAB
Filter the saved CSV. Inspect matching replay rows.
No server solver is running here. The browser filters a precomputed table and redraws the plot locally.
Loading replay rowsReading the saved CSV in this browser.
trap memory proxycurrent collapse proxyrecovery scorethermal risk proxyevidence maturity score
Each metric is normalized independently for shape inspection. Vertical positions do not compare magnitude across metrics.
n/atrap memory proxy
n/acurrent collapse proxy
n/arecovery score
n/athermal risk proxy
n/aevidence maturity score
Change one or more controls to find a saved row. No unrelated CSV value is substituted.
| case id | buffer label | off state stress label | drain bias label | recovery window label | temperature label | switching context label | trap memory proxy | dynamic ron ratio | current collapse proxy | recovery score | thermal risk proxy | measurement caution score | evidence maturity score | decision gate | next safe check |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Loading saved replay rows... | |||||||||||||||
RUN CARD
Conditions before conclusions.
The browser filters saved CSV rows. It does not run TCAD, SPICE, RF, electrothermal, double-pulse, pulsed I-V, uploaded waveform parsing, product qualification, or server-side solvers.
Primary knobs
- buffer context
- off-state stress class
- drain-bias class
- recovery window
- temperature class
- switching context
Saved outputs
- trap-memory proxy
- dynamic-Ron ratio
- current-collapse proxy
- recovery score
- thermal-risk proxy
- switching-loss pressure
- measurement-caution score
- evidence-maturity score
- decision gate
EXPORT
Download the public artifacts.
These exports are the supported public files for review. PDK files and restricted third-party material are not redistributed.
GaN dynamic-Ron replay CSV
/data/gan-dynamic-ron-trap-memory-replay-v88.csv
Open file ->Typed web JSON
/data/gan-dynamic-ron-trap-memory-replay-web-v1.json
Open file ->Model card
/data/gan-dynamic-ron-trap-memory-replay-model-card-v1.md
Open file ->METHODS
How the number was made.
Methods are written for citation discipline: the extraction rule matters as much as the plotted value.
Generate a Cartesian synthetic sweep across buffer context, off-state stress class, drain-bias class, recovery window, temperature class, and switching context.
Keep this method attached when reusing the figure or metric.
Compute educational proxies for trap memory, dynamic-Ron ratio, current collapse, recovery score, thermal risk, switching-loss pressure, measurement caution, and evidence maturity.
Keep this method attached when reusing the figure or metric.
Apply decision gates that route the learner to trap-memory review, recovery-window review, thermal-risk review, switching-context review, measurement-method review, or qualification-evidence-required states.
Keep this method attached when reusing the figure or metric.
Store CSV, typed JSON, model card, source links, and public boundary together with no copied standards text, product data, waveforms, test scripts, recipes, TCAD decks, or supplier process details.
Keep this method attached when reusing the figure or metric.
LIMITS
What this page does not claim.
The MVP is useful because the limits are visible. These statements prevent a teaching simulation from being cited as silicon evidence.
No JEDEC standard body, article body, figure, waveform, test script, product data, supplier process detail, measurement table, TCAD deck, or process recipe is copied.
Carry this boundary into any derivative note, paper draft, or slide.
No live server TCAD/SPICE/RF/electrothermal/double-pulse solver, uploaded waveform parser, device qualification, package recommendation, supplier ranking, or reliability signoff is active.
Carry this boundary into any derivative note, paper draft, or slide.
No wafer recipe, epitaxy condition, converter design instruction, product recommendation, foundry/process claim, or public service intake is enabled.
Carry this boundary into any derivative note, paper draft, or slide.
Rows are normalized synthetic teaching proxies and require owned pulsed I-V, switching waveform, thermal, package, aging, calibration, and device-owner evidence before engineering reuse.
Carry this boundary into any derivative note, paper draft, or slide.
EVIDENCE
Trace the claim back to artifacts.
The evidence route remains the catalog-level browser; this page is the simulation-level reading card.
CSV replay with 5120 rows and explicit stress, drain-bias, buffer, recovery, temperature, switching-context, metric, decision-gate, evidence-state, and next-check fields.
SA-PWR-GAN-DYNAMIC-RON-003
Typed JSON summary with source anchors, axes, decision-gate counts, example rows, role views, average proxy summaries, and public boundary.
SA-PWR-GAN-DYNAMIC-RON-003
Model card saved beside the public dataset and experiment record.
SA-PWR-GAN-DYNAMIC-RON-003
Source spine uses JEDEC, open tutorial, arXiv, PowerAmerica, and link-only news/source signals as outbound anchors only; it does not copy standards, article bodies, figures, data, product rows, waveforms, test scripts, or process recipes.
SA-PWR-GAN-DYNAMIC-RON-003
Source spine
These links anchor the public teaching model. They do not convert the replay into a qualified process recipe or signoff result.
JEDEC JEP173 dynamic on-resistance guidelineOfficial source for dynamic ON-resistance measurement-guideline context. SemiAgora uses the public listing as a link-only anchor and does not copy the standard body.GaN-based power devices tutorialOpen tutorial source for GaN power-device physics, reliability, trapping, dynamic Ron, and pulsed-IV vocabulary. No figures, tables, or article body are copied.OFF-state trapping phenomena in GaN HEMTsOpen metadata/source anchor for drain-bias stress, pulsed I-V, threshold shift, Ron change, and trapping-process vocabulary.Backside insulation and dynamic on-resistance in p-GaN HEMTsOpen metadata/source anchor for substrate/backside context, double-pulse testing, DC stress, and reliability tradeoff vocabulary.PowerAmerica wide-bandgap short coursePublic education source for SiC/GaN, wide-bandgap devices, reliability, and mission-profile vocabulary.TekSiC semi-insulating SiC wafer signalDaily link-only supplier/news signal reinforcing semi-insulating SiC context. Title-level citation only; no supplier claims or process details are copied.
Public execution boundary
No server-side live ngspice execution, uploads, accounts, payments, comments, newsletter signup, or job/event submissions are active on this page.