Cp = 1.44Process potentialUNKNOWNInspect metric contract
Cpk = 1.34Centered capabilityUNKNOWNInspect metric contract
0 / 25Out of specUNKNOWNInspect metric contract
SIMULATION / SA-PROC-METRO-SPC-CAPABILITY-001
SPC and process capability
SPC / Cpk
Replay a CD sample set and compute Cp/Cpk so process spread, centering, and out-of-spec count stay distinct.
EXPLORE
Start with the observable.
Use this page when the simulation is the primary artifact. The linked lesson explains the concept; the linked lab keeps the visual replay surface available.
- Compare the sample mean to the 100 nm target before reading Cp or Cpk.
- Separate spread, centering, and out-of-spec count.
- Use the card as a paper-review checklist for control charts and measurement-system context.
RUN CARD
Conditions before conclusions.
The public page replays saved SPC data. It does not run a factory dashboard, trigger alarms, or release wafers.
Primary knobs
- Sample count: 25 CD points
- Target: 100 nm
- Spec limits: 96 nm and 104 nm
- Capability equations: Cp and Cpk from sample standard deviation
Saved outputs
- sample list
- mean and standard deviation
- Cp and Cpk
- out-of-spec count and public SPC limitations
EXPORT
Download the public artifacts.
These exports are the supported public files for review. PDK files and restricted third-party material are not redistributed.
Dataset JSON
/data/process-spc-capability-web-v1.json
Open file ->Model script
/data/process_metrology_models.py
Open file ->Metrology model card
/data/process-metrology-model-card.md
Open file ->METHODS
How the number was made.
Methods are written for citation discipline: the extraction rule matters as much as the plotted value.
Compute sample mean and sample standard deviation from the saved CD list.
Keep this method attached when reusing the figure or metric.
Compute Cp as specification width divided by six sample standard deviations.
Keep this method attached when reusing the figure or metric.
Compute Cpk as the smaller centered capability against the high and low specification limits.
Keep this method attached when reusing the figure or metric.
Report out-of-spec count separately from capability so excursions and spread are not confused.
Keep this method attached when reusing the figure or metric.
LIMITS
What this page does not claim.
The MVP is useful because the limits are visible. These statements prevent a teaching simulation from being cited as silicon evidence.
No subgrouping, Western Electric rules, gauge R&R, autocorrelation, non-normality, drift correction, or production SPC alarm handling is included.
Carry this boundary into any derivative note, paper draft, or slide.
No qualified metrology, manufacturing release, facility dashboard, wafer acceptance, or process-control claim is implied.
Carry this boundary into any derivative note, paper draft, or slide.
Real SPC evidence requires sampling plan, measurement-system analysis, time order, control limits, operator/tool context, and rights-clean data.
Carry this boundary into any derivative note, paper draft, or slide.
This replay is not a process recipe, release gate, or statistical guarantee.
Carry this boundary into any derivative note, paper draft, or slide.
EVIDENCE
Trace the claim back to artifacts.
The evidence route remains the catalog-level browser; this page is the simulation-level reading card.
The dataset preserves the sample list, spec limits, Cp/Cpk, and out-of-spec count.
SA-PROC-METRO-SPC-CAPABILITY-001
The model script recomputes capability from the saved values.
SA-PROC-METRO-SPC-CAPABILITY-001
NIST/SEMATECH statistics sources anchor the process-monitoring and capability vocabulary.
SA-PROC-METRO-SPC-CAPABILITY-001
Source spine
These links anchor the public teaching model. They do not convert the replay into a qualified process recipe or signoff result.
Public execution boundary
No server-side live ngspice execution, uploads, accounts, payments, comments, newsletter signup, or job/event submissions are active on this page.