Process / geometry
Contact module condition
Surface preparation, silicide, anneal, and contact-area states are teaching inputs, not a recipe.
contact-module-stateCurated evidence path
Contact resistance to read timing
Trace a bounded contact-module state into Rc/Rsd, delay sensitivity, and an SRAM read-timing question without claiming a qualified module or yield result.
Review question
Where does a contact-state proxy stop being defensible as it moves toward product behavior?Permanent path link
- Nodes
- 5
- Bridge edges
- 3
- Stop edges
- 1
- Measured causal edges
- 0
Evidence classes
Read the label before the color.
- ProxyA proxy is not a physical prediction, calibration result, measurement, or causal proof.
- DerivedA derived result inherits every input and model assumption and is not measured evidence.
- ReproducedReproduction establishes the stated run result, not measured-silicon agreement or transfer to another context.
- MeasuredA measurement supports only its declared grain and conditions; it does not automatically prove cross-domain causality.
Ordered evidence chain
Follow each handoff. Stop at the stop.
Node order and edge fields are fixed by the V123 contract. No page interaction generates, ranks, or extends this chain.
- Proxy evidence
Evidence bridge
contact condition to Rc/Rsd
- Edge ID
- contact-process-to-rc
- From node
- contact-module-state
- To node
- contact-resistance-metric
- Unit or category
- ohm / ohm per square
- Evidence class
- Proxy
- Status
- Bridge
- Assumption
- The fixed public surface, anneal, and geometry states are original teaching inputs rather than material-specific process conditions.
- Bridge condition
- Use only inside the saved V122 chain state and keep TLM geometry, fit, and uncertainty requirements visible.
- Limitation
- The mapping excludes material stack, current crowding, local layout, self-heating, variability, and qualified process context.
- Measured replacement slot
- Rights-clean TLM or Kelvin I-V, exact structure geometry, fit residuals, sheet resistance, uncertainty, and wafer genealogy.
- Deep link
- Open this exact edge
Device metric
Rc / Rsd evidence
Contact and sheet-resistance variables are exposed under explicit TLM and model limits.
contact-resistance-metricProxy evidenceEvidence bridge
resistance contribution to delay
- Edge ID
- contact-rc-to-delay
- From node
- contact-resistance-metric
- To node
- contact-delay-sensitivity
- Unit or category
- delay-sensitivity category
- Evidence class
- Proxy
- Status
- Bridge
- Assumption
- The chain coefficient is a bounded original proxy and is not a compact-model, extraction, or silicon correlation.
- Bridge condition
- Compare only fixed chain rows while preserving the stated contact and load assumptions.
- Limitation
- No PDK device model, extracted interconnect, local heating, voltage dependence, or timing corner is included.
- Measured replacement slot
- Correlated TLM, compact-model parameter extraction, ring-oscillator structures, load definition, PVT conditions, and uncertainty.
- Deep link
- Open this exact edge
Circuit behavior
Delay sensitivity
The saved chain rows map resistance proxies into ring-oscillator and bitline-delay sensitivity.
contact-delay-sensitivityProxy evidenceEvidence bridge
bitline delay marker
- Edge ID
- contact-delay-to-sram
- From node
- contact-delay-sensitivity
- To node
- contact-sram-question
- Unit or category
- time / timing category
- Evidence class
- Proxy
- Status
- Bridge
- Assumption
- A saved bitline-delay proxy can frame a read-timing question but does not represent an extracted SRAM array.
- Bridge condition
- Keep the teaching load, threshold marker, cell condition, and absence of array parasitics attached.
- Limitation
- The bridge excludes mismatch, sense-amplifier offset, array topology, PVT, IR drop, and compiler timing.
- Measured replacement slot
- Matched contact split and SRAM test structure with extracted array RC, sense condition, PVT, mismatch, and read-timing measurements.
- Deep link
- Open this exact edge
System / yield proxy
SRAM read-timing question
Bitline delay can frame a read question but cannot predict array Vmin, yield, or qualification.
contact-sram-questionProxy evidenceEvidence stop
array Vmin or yield consequence
- Edge ID
- contact-sram-to-yield-stop
- From node
- contact-sram-question
- To node
- contact-production-stop
- Unit or category
- unsupported category
- Evidence class
- Proxy
- Status
- Stop
- Assumption
- No direct public dataset links the teaching contact state to qualified array yield.
- Bridge condition
- Stop before any Vmin, yield, qualification, disposition, or production statement.
- Limitation
- Separate contact, circuit, and SRAM replays do not establish cross-domain measured causality.
- Measured replacement slot
- Lot-wafer-die genealogy joining contact metrology, device characterization, array Vmin, test coverage, yield labels, uncertainty, and accountable review.
- Deep link
- Open this exact edge
Evidence stop
Stop before qualification
No public measured correlation closes the contact-module, circuit-timing, and product-yield chain.
contact-production-stop
Path boundary
This path does not prove causality.
The navigator presents curated associations, assumptions, evidence classes, and replacement needs. It does not prove physical or statistical causality.
A stop is a product requirement, not missing UI. The page must not fill a stopped bridge with extrapolation, AI text, a recipe, an equipment setting, or an operating recommendation.
No public path authorizes process changes, equipment control, wafer disposition, qualification, signoff, product ranking, or production release.
Return to all causal chains